Spectroscopic ellipsometry of CsPbCl\({_3}\) perovskite thin films

Designing optoelectronic devices based on cesium lead chloride (CsPbCl\({_3}\)) perovskites requires accurate values of their optical constants. Unfortunately, experimental data for this material is very limited thus far. Therefore, here, we applied spectroscopic ellipsometry (SE) to measure the com...

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Bibliographic Details
Published in:arXiv.org 2024-12
Main Authors: Khan, Sana, Cegielski, Piotr J, Runkel, Manuel, Riedl, Thomas, Mohammadi, Maryam, Lemme, Max C
Format: Article
Language:English
Subjects:
Absorption spectra
Absorption spectroscopy
Cesium
Harmonic oscillators
Lead chlorides
Optoelectronic devices
Perovskites
Silicon substrates
Spectroellipsometry
Spectrum analysis
Thickness measurement
Thin films
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Summary:Designing optoelectronic devices based on cesium lead chloride (CsPbCl\({_3}\)) perovskites requires accurate values of their optical constants. Unfortunately, experimental data for this material is very limited thus far. Therefore, here, we applied spectroscopic ellipsometry (SE) to measure the complex optical constants of thermally evaporated CsPbCl\({_3}\) thin films with different thicknesses on Si/SiO\({_2}\) substrates. The data were corroborated with scanning electron microscopy (SEM) images and absorption spectroscopy. An optical dispersion model was developed to derive the complex optical constants and film thicknesses. The Tauc-Lorentz model, in conjunction with two harmonic oscillators, was used to extract the required parameters. The extinction coefficient spectrum exhibited a sharp absorption edge at 411 nm, consistent with the absorption spectrum. In addition, the optical bandgap of the film was calculated from the absorption spectra and SE data. The experimental values agree well with the simulation results, with values of \(\sim\) 2.99 eV for different film thicknesses. This work provides fundamental information for designing and modeling CsPbCl3-based optoelectronic devices.
ISSN:2331-8422