Synchrotron-based diffraction-enhanced imaging and diffraction-enhanced imaging combined with CT X-ray imaging systems to image seeds at 30 keV

• Published in: Applied physics. A, Materials science & processing Materials science & processing, 2025, Vol.131 (1)
• Main Authors: Rao, D. V., Gigante, G. E., Zhong, Z., Cesareo, R., Brunetti, A., Schiavon, N., Akatsuka, T., Yuasa, T., Takeda, T.
• Format: Article
• Language: English
• Subjects: Characterization and Evaluation of Materials; Chickpeas; Computed tomography; Condensed Matter Physics; Image acquisition; Machines; Manufacturing; Morphology; Nanotechnology; Optical and Electronic Materials; Physics; Physics and Astronomy; Plant roots; Processes; Surfaces and Interfaces; Synchrotron radiation; Thin Films; X ray imagery; X-rays
• ISSN: 0947-8396; 1432-0630
• DOI: 10.1007/s00339-024-08122-1

Utilized the upgraded Synchrotron-based non-destructive Diffraction-enhanced imaging and Diffraction-enhanced imaging coupled with CT X-ray imaging systems to image the chickpea seeds, to enhance the contrast in plant root architecture, visibility of fine structures of root architecture growth and some aspects of physiology at acceptable level. DEI-CT images were acquired with 30 keV synchrotron X-rays. A series of DEI-CT slices were assembled together, to form a 3D data set. DEI-CT images explored more structural information and morphology. Noticed detailed anatomical, physiological observations, and contrast mechanisms. With these systems, some of the complex plant traits, root morphology, growth of laterals and subsequent laterals can be visualized directly.