On the Use of Reflection Polarized Optical Microscopy for Rapid Comparison of Crystallinity and Phase Segregation of P3HT:PCBM Thin Films

Inside Front Cover: Polarized optical microscopy (POM) is a rapid, non‐destructive technique for evaluating the crystallinity and phase segregation of thin films of organic semiconductor blends. In article 2400577, Frédéric Laquai, Christopher Petoukhoff, and co‐workers demonstrate methods to reduce...

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Bibliographic Details
Published in:Macromolecular rapid communications. 2024-12, Vol.45 (24)
Main Authors: Alzahrani, Rawan A., Alshehri, Nisreen, Alessa, Alaa A., Amer, Doha A., Matiash, Oleksandr, De Castro, Catherine S. P., Alam, Shahidul, Jurado, José P., Gorenflot, Julien, Laquai, Frédéric, Petoukhoff, Christopher E.
Format: Article
Language:English
Subjects:
Crystallinity
Fullerenes
Light microscopy
Optical microscopy
Polymer blends
Polymers
Thin films
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Summary:Inside Front Cover: Polarized optical microscopy (POM) is a rapid, non‐destructive technique for evaluating the crystallinity and phase segregation of thin films of organic semiconductor blends. In article 2400577, Frédéric Laquai, Christopher Petoukhoff, and co‐workers demonstrate methods to reduce aberrations and maximize POM contrast, including the use of the reflection geometry, Köhler illumination, and slightly uncrossed polarizers. It is shown that the contrast in POM images directly correlates with both the degree of polymer crystallinity and phase segregation within polymer:fullerene blends.
ISSN:1022-1336
1521-3927
DOI:10.1002/marc.202470051