CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing

• Published in: Journal of electronic testing 2002-08, Vol.18 (4-5), p.455
• Main Authors: Benabdenbi, Mounir, Maroufi, Walid, Marzouki, Meryem
• Format: Article
• Language: English
• Subjects: Product testing; Semiconductors
• ISSN: 0923-8174; 1573-0727
• DOI: 10.1023/A:1016597624753

As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CAS-BUS that solves some of the new problems the test industry has to deal with. This TAM is scalable, flexible and dynamically reconfigurable. The CAS-BUS architecture is compatible with the IEEE P1500 standard proposal in its current state of development, and is controlled by Boundary Scan features. This basic CAS-BUS architecture has been extended with two independent variants. The first extension has been designed in order to manage SoC made up with both wrapped cores and non wrapped cores with Boundray Scan features. The second deals with a test pin expansion method in order to solve the I/O bandwidth problem. The proposed solution is based on a new compression/decompression mechanism which provides significant results in case of non correlated test patterns processing. This solution avoids TAM performance degradation. These test architectures are based on the CAS-BUS TAM and allow trade-offs to optimize both test time and area overhead. A tool-box environment is provided, in order to automatically generate the needed component to build the chosen SoC test architecture.[PUBLICATION ABSTRACT]