Measurement of Planar Substrate Uniaxial Anisotropy

A new technique to measure uniaxial anisotropy in planar substrates is described. The technique uses a single dual-mode resonator. Each mode of the resonator has a different distribution of horizontal (parallel to the substrate surface) and vertical (perpendicular to the substrate surface) directed...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 2009-10, Vol.57 (10), p.2456-2463
Main Authors: Rautio, J.C., Arvas, S.
Format: Article
Language:English
Subjects:
Anisotropic magnetoresistance
Anisotropy
Applied sciences
Circuit properties
Dielectric constant
Dielectric measurements
Dielectric substrates
dispersion
Electric, optical and optoelectronic circuits
electromagnetic (EM) analysis
Electromagnetic measurements
Electronic circuits
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Error analysis
Exact sciences and technology
FR-4
FR4
Horizontal
Magnetic anisotropy
Magnetic field measurement
Magnetic resonance
measurement
method of moments (MoM)
Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits
Microwaves
Oscillators, resonators, synthetizers
Perpendicular magnetic anisotropy
printed circuit board (PCB)
Resonant frequencies
Resonant frequency
Resonators
Tangents
transmission line
uniaxial
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:A new technique to measure uniaxial anisotropy in planar substrates is described. The technique uses a single dual-mode resonator. Each mode of the resonator has a different distribution of horizontal (parallel to the substrate surface) and vertical (perpendicular to the substrate surface) directed fields. Using an electromagnetic analysis of the dual-mode resonator, the resonant frequencies of the modes are space mapped to the horizontal and vertical dielectric constants. The space mapping allows the anisotropic dielectric constants to be extracted from the measured resonant frequencies. It is also suggested that this technique can be applied to magnetic uniaxial anisotropy as well as to magnetic and electric loss tangent anisotropy. The dual and quad "RA" resonators are introduced in this paper. A measurement of FR4 (a common anisotropic epoxy-glass weave composite substrate) with a detailed error analysis illustrates the technique.
ISSN:0018-9480
1557-9670
DOI:10.1109/TMTT.2009.2029030