Characterization of Skip or Far Track Erasure in a Side Shield Design

Side track erasure (STE), either skip or far track, has been studied for a PMR writer with side shielded (SS) design. Both bit error rate (BER) and noise amplitude based STE measurements indicate the side writing fields are strong at SS bottom corners and/or inner edges. With DC background low-frequ...

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Bibliographic Details
Published in:IEEE transactions on magnetics 2009-10, Vol.45 (10), p.3660-3663
Main Authors: Yue Liu, Takano, K., Bai, D., Xiaofeng Zhang, Kowang Liu, Yan Wu, Dovek, M.
Format: Article
Language:English
Subjects:
Amplitudes
Bit error rate
Corners
Cross-disciplinary physics: materials science
rheology
Design engineering
Exact sciences and technology
Flux
Low-frequency noise
Magnetic analysis
Magnetic field measurement
Magnetic force microscope
Magnetic force microscopy
Magnetic forces
Magnetism
Materials science
Noise level
Noise measurement
Other topics in materials science
perpendicular recording
Physics
Polarity
Poles
Shields
side shields
side track erasure
Skips
Switches
Writing
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Summary:Side track erasure (STE), either skip or far track, has been studied for a PMR writer with side shielded (SS) design. Both bit error rate (BER) and noise amplitude based STE measurements indicate the side writing fields are strong at SS bottom corners and/or inner edges. With DC background low-frequency noise amplitude measurement, the root cause of the STE is characterized as flux from main pole tip going into media soft under-layer (SUL) and returning to SS bottom corners and/or inner edges. Moreover, the return flux path is identified with a unique one-sided signature depending on the pole polarity and shield initialization direction and can switch side when pole polarity or shield initialization direction is changed. By employing magnetic force microscope (MFM) analysis of a SS head under two shield initialization directions, we can explain this unique one-sided flux path by the observed SS domain structure. Furthermore, a micro-magnetic modeling of the SS design is constructed to understand the observation qualitatively.
ISSN:0018-9464
1941-0069
DOI:10.1109/TMAG.2009.2022052