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Characterization of an InGaAs/InP-based single-photon avalanche diode with gated-passive quenching with active reset circuit
An improved gated-mode passive quenching with active reset (gated-PQAR) circuit is utilized in conjunction with an InGaAs/InP single-photon avalanche photodiode (SPAD). Photon detection efficiency (PDE) and dark count probability (DCP) were measured at a gate repetition rate of 1 MHz. The reduced af...
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Published in: | Journal of modern optics 2011-02, Vol.58 (3-4), p.201-209 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | An improved gated-mode passive quenching with active reset (gated-PQAR) circuit is utilized in conjunction with an InGaAs/InP single-photon avalanche photodiode (SPAD). Photon detection efficiency (PDE) and dark count probability (DCP) were measured at a gate repetition rate of 1 MHz. The reduced afterpulsing afforded by the gated-PQAR circuit enabled measurement of afterpulsing for hold-off times as short as 10 ns. The timing resolution (jitter) for different excess biases has also been investigated. At 230 K and an excess bias of 2.5 V, 0.3% afterpulse probability for a 10 ns hold-off time was achieved with 13% PDE, 2 × 10
−6
DCP, 160 ps jitter, and 0.2 ns effective gate width. For the same hold-off time, at a higher excess bias of 3.5 V, 30% PDE, 1 × 10
−5
DCP and 120 ps jitter were achieved with 7% afterpulse probability with an effective gate width of 0.7 ns. |
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ISSN: | 0950-0340 1362-3044 |
DOI: | 10.1080/09500340.2010.515749 |