Uncertainties of VNA S-Parameter Measurements Applying the TAN Self-Calibration Method

For the seven-term general through-attenuator-network (TAN) self-calibration method of a four-sampler vector network analyzer and for all derived calibration methods such as through-line-network, through-reflect-line, through-reflect-match, through-attenuator-reflect, or through-match-network, expre...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 2007-04, Vol.56 (2), p.597-600
Main Author: Stumper, U.
Format: Article
Language:English
Subjects:
Attenuators
Automatic testing
Budgeting
Calibration
Connectors
Contact resistance
Crosstalk
Deviation
Instrumentation
Mathematical analysis
Reflection
Scattering parameters
sensitivity coefficients
seven-term through-attenuator-network (TAN) calibration
through-reflect-line (TRL) calibration
through-reflect-match (TRM) calibration
Transmission line measurements
Uncertainty
vector network analyzer (VNA)
Vectors (mathematics)
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Summary:For the seven-term general through-attenuator-network (TAN) self-calibration method of a four-sampler vector network analyzer and for all derived calibration methods such as through-line-network, through-reflect-line, through-reflect-match, through-attenuator-reflect, or through-match-network, expressions for the deviations of the measured S-parameters of two-port test objects (device under test) from their true values, which are caused by deviations of the S-parameters of nonideal calibration elements ("standards") from their ideal values, are presented. These sensitivity coefficients can be used for establishing the type-B uncertainty budget for S-parameter measurements
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2007.891051