Prediction of Radiated Emissions Using Near-Field Measurements

• Published in: IEEE transactions on electromagnetic compatibility 2011-11, Vol.53 (4), p.891-899
• Main Authors: Weng, Haixiao, Beetner, Daryl G., DuBroff, Richard E.
• Format: Article
• Language: English
• Subjects: Antennas; Applied classical electromagnetism; Applied sciences; Current sources; Electric variables measurement; Electrical engineering. Electrical power engineering; Electromagnetic compatibility; Electromagnetic interference; electromagnetic measurements; Electromagnetic wave propagation, radiowave propagation; Electromagnetism; electron and ion optics; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics; Electronics; Equivalence; estimation; Exact sciences and technology; Finite difference method; Finite difference time domain method; Fundamental areas of phenomenology (including applications); Information, signal and communications theory; Magnetic domains; Magnetic field measurement; Mathematical models; Microstrip; modeling; Physics; Power electronics, power supplies; Probes; Scattering; Telecommunications and information theory; Time domain analysis
• ISSN: 0018-9375; 1558-187X
• DOI: 10.1109/TEMC.2011.2141998

A procedure is developed to predict electromagnetic interference from electronic products using near-field scan data. Measured near-field data are used to define equivalent electric and magnetic current sources characterizing the electromagnetic emissions from an electronic circuit. Reconciliation of the equivalent sources is performed to allow the sources to be accurately applied within full-wave numerical modeling tools like finite-difference time domain (FDTD). Results show that the radiated fields must typically be represented by both electric and magnetic current sources if scattering and multiple-reflections from nearby objects are to be taken into account. The accuracy of the approach is demonstrated by predicting the fields generated by a microstrip trace within and outside of a slotted enclosure, and by predicting the fields generated by the microstrip trace close to a long wire. Values predicted from near-field scan data match those from full-wave simulations or measurements within 6 dB.