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Observation of Instability Growth in a Copper Z-Pinch Target Using Two-Color Monochromatic X-Ray Backlighting

Existing monochromatic X-ray backlighting diagnostics at 1.865 and 6.151 keV have been combined to create a two-color monochromatic X-ray backlighting diagnostic. The use of different photon energies can allow a much broader range of areal densities to be observed in a single experiment. Here, we ap...

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Published in:IEEE transactions on plasma science 2011-11, Vol.39 (11), p.2408-2409
Main Authors: Sinars, D. B., Peterson, K. J., Slutz, S. A., Herrmann, M. C., Yu, E. P., Cuneo, M. E., Smith, I. C., Bennett, G. R., Atherton, B. W., Porter, J. L., Wenger, D. F.
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Language:English
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Summary:Existing monochromatic X-ray backlighting diagnostics at 1.865 and 6.151 keV have been combined to create a two-color monochromatic X-ray backlighting diagnostic. The use of different photon energies can allow a much broader range of areal densities to be observed in a single experiment. Here, we apply the two-color backlighter to the study of instability growth on the outside edge of an initially solid copper rod target driven by a 100-ns rise-time current pulse with a peak value of 20 MA. The different opacity of Cu at these two photon energies allows a dynamic range of ~ 1600x to be surveyed instead of ~ 60x (assuming a useful transmission range of 5%-95%).
ISSN:0093-3813
1939-9375
DOI:10.1109/TPS.2011.2140339