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Development of Testing Device for Critical Current Measurements for HTS/LTS
For the goal of superconducting magnet applications in the advanced testing device for high temperature superconducting (HTS) wire and sample coils, a wide bore conduction-cooled superconducting magnet with available warm bore of phi 186 mm and center field of 5 T for the background magnetic field a...
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| Published in: | IEEE transactions on applied superconductivity 2009-06, Vol.19 (3), p.2325-2328 |
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| Main Authors: | , , , , , , , , , , , , , , , , , , |
| Format: | Article |
| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c385t-6107aad39ee622384e44b4ccb396c49b8a3c6ec9696e89e56b6aa786a0d020063 |
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| cites | cdi_FETCH-LOGICAL-c385t-6107aad39ee622384e44b4ccb396c49b8a3c6ec9696e89e56b6aa786a0d020063 |
| container_end_page | 2328 |
| container_issue | 3 |
| container_start_page | 2325 |
| container_title | IEEE transactions on applied superconductivity |
| container_volume | 19 |
| creator | Wang, Qiuliang Dai, Yinming Zhao, Baozhi Song, Shousen Cao, Zhiqiang Chen, Shunzhong Zhang, Quan Wang, Housheng Cheng, Junsheng Lei, Yuanzhong Ye, Bai Li, Xian Liu, Jianhua Zhao, Shangwu Zhang, Hongjie Hu, Xinning Wang, Chunzhong Yan, Luguang Kim, Keeman |
| description | For the goal of superconducting magnet applications in the advanced testing device for high temperature superconducting (HTS) wire and sample coils, a wide bore conduction-cooled superconducting magnet with available warm bore of phi 186 mm and center field of 5 T for the background magnetic field applications was designed and fabricated and tested. A sample cryostat with two GM cryocoolers is inserted in the background magnet. The system allows measurements to be performed in a repeatable and reliable fashion. The detailed design, fabrication and thermal analysis are presented in the paper. |
| doi_str_mv | 10.1109/TASC.2009.2018415 |
| format | article |
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A sample cryostat with two GM cryocoolers is inserted in the background magnet. The system allows measurements to be performed in a repeatable and reliable fashion. The detailed design, fabrication and thermal analysis are presented in the paper.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/TASC.2009.2018415</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Boring ; Boring tools ; Conduction-cooled superconducting magnet ; Critical current ; Current measurement ; Design engineering ; Devices ; Diameters ; Electrical engineering. Electrical power engineering ; electro-plastic model ; Electromagnets ; Electronics ; Exact sciences and technology ; High temperature superconductors ; HTS test devices ; Magnetic field measurement ; Magnetic fields ; Performance evaluation ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Superconducting coils ; Superconducting devices ; Superconducting filaments and wires ; Superconducting magnets ; Superconductivity ; Testing ; Testing, measurement, noise and reliability ; Testing. Reliability. Quality control ; Various equipment and components ; Wire</subject><ispartof>IEEE transactions on applied superconductivity, 2009-06, Vol.19 (3), p.2325-2328</ispartof><rights>2009 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2009</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c385t-6107aad39ee622384e44b4ccb396c49b8a3c6ec9696e89e56b6aa786a0d020063</citedby><cites>FETCH-LOGICAL-c385t-6107aad39ee622384e44b4ccb396c49b8a3c6ec9696e89e56b6aa786a0d020063</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5153098$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,23921,23922,25131,27915,27916,54787</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=21986240$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Wang, Qiuliang</creatorcontrib><creatorcontrib>Dai, Yinming</creatorcontrib><creatorcontrib>Zhao, Baozhi</creatorcontrib><creatorcontrib>Song, Shousen</creatorcontrib><creatorcontrib>Cao, Zhiqiang</creatorcontrib><creatorcontrib>Chen, Shunzhong</creatorcontrib><creatorcontrib>Zhang, Quan</creatorcontrib><creatorcontrib>Wang, Housheng</creatorcontrib><creatorcontrib>Cheng, Junsheng</creatorcontrib><creatorcontrib>Lei, Yuanzhong</creatorcontrib><creatorcontrib>Ye, Bai</creatorcontrib><creatorcontrib>Li, Xian</creatorcontrib><creatorcontrib>Liu, Jianhua</creatorcontrib><creatorcontrib>Zhao, Shangwu</creatorcontrib><creatorcontrib>Zhang, Hongjie</creatorcontrib><creatorcontrib>Hu, Xinning</creatorcontrib><creatorcontrib>Wang, Chunzhong</creatorcontrib><creatorcontrib>Yan, Luguang</creatorcontrib><creatorcontrib>Kim, Keeman</creatorcontrib><title>Development of Testing Device for Critical Current Measurements for HTS/LTS</title><title>IEEE transactions on applied superconductivity</title><addtitle>TASC</addtitle><description>For the goal of superconducting magnet applications in the advanced testing device for high temperature superconducting (HTS) wire and sample coils, a wide bore conduction-cooled superconducting magnet with available warm bore of phi 186 mm and center field of 5 T for the background magnetic field applications was designed and fabricated and tested. A sample cryostat with two GM cryocoolers is inserted in the background magnet. The system allows measurements to be performed in a repeatable and reliable fashion. The detailed design, fabrication and thermal analysis are presented in the paper.</description><subject>Applied sciences</subject><subject>Boring</subject><subject>Boring tools</subject><subject>Conduction-cooled superconducting magnet</subject><subject>Critical current</subject><subject>Current measurement</subject><subject>Design engineering</subject><subject>Devices</subject><subject>Diameters</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>electro-plastic model</subject><subject>Electromagnets</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>High temperature superconductors</subject><subject>HTS test devices</subject><subject>Magnetic field measurement</subject><subject>Magnetic fields</subject><subject>Performance evaluation</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Superconducting coils</subject><subject>Superconducting devices</subject><subject>Superconducting filaments and wires</subject><subject>Superconducting magnets</subject><subject>Superconductivity</subject><subject>Testing</subject><subject>Testing, measurement, noise and reliability</subject><subject>Testing. Reliability. Quality control</subject><subject>Various equipment and components</subject><subject>Wire</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNp9kT1PwzAQhiMEEqXwAxBLhARMaX3xR-2xCh9FFDE0zJbrXlCqNCl2gsS_x6FVBwYW27Kf93TnJ4ougYwAiBrn00U2SglRYQHJgB9FA-BcJikHfhzOhEMi05SeRmferwkBJhkfRC_3-IVVs91g3cZNEefo27L-iMN1aTEuGhdnrmxLa6o465zrsVc0vnPYR_wvMcsX43m-OI9OClN5vNjvw-j98SHPZsn87ek5m84TSyVvEwFkYsyKKkQRGpIMGVsya5dUCcvUUhpqBVollECpkIulMGYihSErEiYUdBjd7epuXfPZhYb1pvQWq8rU2HReywknoBTIQN7-S1JBaQAhgNd_wHXTuTpMoRWkhKoJUwGCHWRd473DQm9duTHuWwPRvQXdW9C9Bb23EDI3-8LGhz8snKlt6Q_BFJQUKSOBu9pxJSIenoM7SpSkP3lCjf8</recordid><startdate>20090601</startdate><enddate>20090601</enddate><creator>Wang, Qiuliang</creator><creator>Dai, Yinming</creator><creator>Zhao, Baozhi</creator><creator>Song, Shousen</creator><creator>Cao, Zhiqiang</creator><creator>Chen, Shunzhong</creator><creator>Zhang, Quan</creator><creator>Wang, Housheng</creator><creator>Cheng, Junsheng</creator><creator>Lei, Yuanzhong</creator><creator>Ye, Bai</creator><creator>Li, Xian</creator><creator>Liu, Jianhua</creator><creator>Zhao, Shangwu</creator><creator>Zhang, Hongjie</creator><creator>Hu, Xinning</creator><creator>Wang, Chunzhong</creator><creator>Yan, Luguang</creator><creator>Kim, Keeman</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Electrical power engineering</topic><topic>electro-plastic model</topic><topic>Electromagnets</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>High temperature superconductors</topic><topic>HTS test devices</topic><topic>Magnetic field measurement</topic><topic>Magnetic fields</topic><topic>Performance evaluation</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Superconducting coils</topic><topic>Superconducting devices</topic><topic>Superconducting filaments and wires</topic><topic>Superconducting magnets</topic><topic>Superconductivity</topic><topic>Testing</topic><topic>Testing, measurement, noise and reliability</topic><topic>Testing. Reliability. 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| identifier | ISSN: 1051-8223 |
| ispartof | IEEE transactions on applied superconductivity, 2009-06, Vol.19 (3), p.2325-2328 |
| issn | 1051-8223 1558-2515 |
| language | eng |
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| source | IEEE Xplore (Online service) |
| subjects | Applied sciences Boring Boring tools Conduction-cooled superconducting magnet Critical current Current measurement Design engineering Devices Diameters Electrical engineering. Electrical power engineering electro-plastic model Electromagnets Electronics Exact sciences and technology High temperature superconductors HTS test devices Magnetic field measurement Magnetic fields Performance evaluation Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Superconducting coils Superconducting devices Superconducting filaments and wires Superconducting magnets Superconductivity Testing Testing, measurement, noise and reliability Testing. Reliability. Quality control Various equipment and components Wire |
| title | Development of Testing Device for Critical Current Measurements for HTS/LTS |
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