Addition to "ADC testing"

In the April 2006 issue of IEEE Instrumentation and Measurement Magazine, "ADC Testing," the seventh in a series of tutorials on instrumentation and measurements, was presented. The authors have created a table that summarizes the parameters that are extracted from each ADC test setup that...

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Bibliographic Details
Published in:IEEE instrumentation & measurement magazine 2006-10, Vol.9 (5), p.46-46
Main Authors: Linnenbrink, T.E., Blair, J., Rapuano, S., Daponte, P., Balestrieri, E., De Vito, L., Max, S., Tilden, S.J.
Format: Magazinearticle
Language:English
Subjects:
Apertures
Bandwidth
Feedback loop
Instrumentation
Instrumentation and measurement
Intermodulation distortion
Propagation delay
Readers
Tables (data)
Testing
Uncertainty
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Description
Summary:In the April 2006 issue of IEEE Instrumentation and Measurement Magazine, "ADC Testing," the seventh in a series of tutorials on instrumentation and measurements, was presented. The authors have created a table that summarizes the parameters that are extracted from each ADC test setup that was presented in the tutorial. It is an easy reference guide for readers to find the topic they are researching
ISSN:1094-6969
1941-0123
DOI:10.1109/MIM.2006.1708350