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An Unassisted, Low Trigger-, and High Holding-Voltage SCR (uSCR) for On-Chip ESD-Protection Applications
A new silicon-controlled rectifier (SCR) is proposed and realized in a 0.35-mum/3.3-V fully salicided BiCMOS process for electrostatic-discharge (ESD) applications. Without using an external trigger circuitry, the unassisted SCR has a trigger voltage as low as 7 V to effectively protect deep-submicr...
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Published in: | IEEE electron device letters 2007-12, Vol.28 (12), p.1120-1122 |
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container_issue | 12 |
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container_title | IEEE electron device letters |
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creator | Lifang Lou Liou, J.J. |
description | A new silicon-controlled rectifier (SCR) is proposed and realized in a 0.35-mum/3.3-V fully salicided BiCMOS process for electrostatic-discharge (ESD) applications. Without using an external trigger circuitry, the unassisted SCR has a trigger voltage as low as 7 V to effectively protect deep-submicrometer MOS circuits, a holding voltage higher than the supply voltage to minimize transient influence and avoid latch-up issue, and a second snapback current density exceeding 60 mA/mum to provide robust ESD-protection solutions. |
doi_str_mv | 10.1109/LED.2007.909838 |
format | article |
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Without using an external trigger circuitry, the unassisted SCR has a trigger voltage as low as 7 V to effectively protect deep-submicrometer MOS circuits, a holding voltage higher than the supply voltage to minimize transient influence and avoid latch-up issue, and a second snapback current density exceeding 60 mA/mum to provide robust ESD-protection solutions.</description><identifier>ISSN: 0741-3106</identifier><identifier>EISSN: 1558-0563</identifier><identifier>DOI: 10.1109/LED.2007.909838</identifier><identifier>CODEN: EDLEDZ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; BiCMOS integrated circuits ; Breakdown voltage ; Circuits ; Current density ; Design engineering ; Devices ; Electric potential ; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics ; Electronics ; Electrostatic discharge ; Electrostatic discharge (ESD) ; Exact sciences and technology ; high holding voltage ; Latch-up ; low trigger voltage ; Low voltage ; Metal oxide semiconductors ; Protection ; Rectifiers ; Robustness ; silicon-controlled rectifier (SCR) ; Thyristors ; Voltage</subject><ispartof>IEEE electron device letters, 2007-12, Vol.28 (12), p.1120-1122</ispartof><rights>2008 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2007</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c381t-bdf488576916b4e71cfd87fc7267334e7bc250248831d91b81db1cedf3f6c5b93</citedby><cites>FETCH-LOGICAL-c381t-bdf488576916b4e71cfd87fc7267334e7bc250248831d91b81db1cedf3f6c5b93</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4383546$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=19876845$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Lifang Lou</creatorcontrib><creatorcontrib>Liou, J.J.</creatorcontrib><title>An Unassisted, Low Trigger-, and High Holding-Voltage SCR (uSCR) for On-Chip ESD-Protection Applications</title><title>IEEE electron device letters</title><addtitle>LED</addtitle><description>A new silicon-controlled rectifier (SCR) is proposed and realized in a 0.35-mum/3.3-V fully salicided BiCMOS process for electrostatic-discharge (ESD) applications. Without using an external trigger circuitry, the unassisted SCR has a trigger voltage as low as 7 V to effectively protect deep-submicrometer MOS circuits, a holding voltage higher than the supply voltage to minimize transient influence and avoid latch-up issue, and a second snapback current density exceeding 60 mA/mum to provide robust ESD-protection solutions.</description><subject>Applied sciences</subject><subject>BiCMOS integrated circuits</subject><subject>Breakdown voltage</subject><subject>Circuits</subject><subject>Current density</subject><subject>Design engineering</subject><subject>Devices</subject><subject>Electric potential</subject><subject>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</subject><subject>Electronics</subject><subject>Electrostatic discharge</subject><subject>Electrostatic discharge (ESD)</subject><subject>Exact sciences and technology</subject><subject>high holding voltage</subject><subject>Latch-up</subject><subject>low trigger voltage</subject><subject>Low voltage</subject><subject>Metal oxide semiconductors</subject><subject>Protection</subject><subject>Rectifiers</subject><subject>Robustness</subject><subject>silicon-controlled rectifier (SCR)</subject><subject>Thyristors</subject><subject>Voltage</subject><issn>0741-3106</issn><issn>1558-0563</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNp9kU2LFDEQhhtRcFw9e_ASBL9gM5t0vo_D7OgIAyvurteQTic9WXqT3qQH8d-bYRYFD16qiqqnXqp4m-Y1RkuMkbrYbS6XLUJiqZCSRD5pFpgxCRHj5GmzQIJiSDDiz5sXpdwhhCkVdNHsVxHcRlNKKLPrz8Eu_QQ3OQyDy_AcmNiDbRj2YJvGPsQB_kjjbAYHrtffwcdDjZ-ATxlcRbjehwlsri_ht5xmZ-eQIlhN0xisOdblZfPMm7G4V4_5rLn9vLlZb-Hu6svX9WoHLZF4hl3vqZRMcIV5R53A1vdSeCtaLgipjc62DLWVIbhXuJO477B1vSeeW9YpctZ8OOlOOT0cXJn1fSjWjaOJLh2KlhJxjggTlXz_X5JQhuolqIJv_wHv0iHH-oVWuMWKMNpW6OIE2ZxKyc7rKYd7k39pjPTRIF0N0keD9MmguvHuUdYUa0afTbSh_F1TUnBJWeXenLjgnPszplWBUU5-A5CtldA</recordid><startdate>20071201</startdate><enddate>20071201</enddate><creator>Lifang Lou</creator><creator>Liou, J.J.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20071201</creationdate><title>An Unassisted, Low Trigger-, and High Holding-Voltage SCR (uSCR) for On-Chip ESD-Protection Applications</title><author>Lifang Lou ; Liou, J.J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c381t-bdf488576916b4e71cfd87fc7267334e7bc250248831d91b81db1cedf3f6c5b93</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Applied sciences</topic><topic>BiCMOS integrated circuits</topic><topic>Breakdown voltage</topic><topic>Circuits</topic><topic>Current density</topic><topic>Design engineering</topic><topic>Devices</topic><topic>Electric potential</topic><topic>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</topic><topic>Electronics</topic><topic>Electrostatic discharge</topic><topic>Electrostatic discharge (ESD)</topic><topic>Exact sciences and technology</topic><topic>high holding voltage</topic><topic>Latch-up</topic><topic>low trigger voltage</topic><topic>Low voltage</topic><topic>Metal oxide semiconductors</topic><topic>Protection</topic><topic>Rectifiers</topic><topic>Robustness</topic><topic>silicon-controlled rectifier (SCR)</topic><topic>Thyristors</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lifang Lou</creatorcontrib><creatorcontrib>Liou, J.J.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998–Present</collection><collection>IEEE Electronic Library Online</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE electron device letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lifang Lou</au><au>Liou, J.J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An Unassisted, Low Trigger-, and High Holding-Voltage SCR (uSCR) for On-Chip ESD-Protection Applications</atitle><jtitle>IEEE electron device letters</jtitle><stitle>LED</stitle><date>2007-12-01</date><risdate>2007</risdate><volume>28</volume><issue>12</issue><spage>1120</spage><epage>1122</epage><pages>1120-1122</pages><issn>0741-3106</issn><eissn>1558-0563</eissn><coden>EDLEDZ</coden><abstract>A new silicon-controlled rectifier (SCR) is proposed and realized in a 0.35-mum/3.3-V fully salicided BiCMOS process for electrostatic-discharge (ESD) applications. 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source | IEEE Xplore (Online service) |
subjects | Applied sciences BiCMOS integrated circuits Breakdown voltage Circuits Current density Design engineering Devices Electric potential Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Electrostatic discharge Electrostatic discharge (ESD) Exact sciences and technology high holding voltage Latch-up low trigger voltage Low voltage Metal oxide semiconductors Protection Rectifiers Robustness silicon-controlled rectifier (SCR) Thyristors Voltage |
title | An Unassisted, Low Trigger-, and High Holding-Voltage SCR (uSCR) for On-Chip ESD-Protection Applications |
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