Identification of Dominant Noise Source and Parameter Sensitivity for Substrate Coupling

A simple, yet physically intuitive macrolevel model is presented to identify the dominant substrate coupling mechanism at the early stages of the design process, while simultaneously considering multiple parameters. Furthermore, the sensitivity of substrate noise to these parameters is evaluated, de...

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Bibliographic Details
Published in:IEEE transactions on very large scale integration (VLSI) systems 2009-10, Vol.17 (10), p.1559-1564
Main Authors: Salman, E., Friedman, E.G., Secareanu, R.M., Hartin, O.L.
Format: Article
Language:English
Subjects:
Applied sciences
Circuit noise
Coupling circuits
Design engineering
Dielectric substrates
Digital circuits
Dominant substrate noise source
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Integrated circuits
Joining
Mathematical models
mixed-signal circuits
Noise
Noise generators
Noise reduction
Parameter sensitivity
Process design
Radio frequency
Radiofrequency identification
Semiconductor device noise
substrate noise coupling
Theoretical study. Circuits analysis and design
Very large scale integration
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Description
Summary:A simple, yet physically intuitive macrolevel model is presented to identify the dominant substrate coupling mechanism at the early stages of the design process, while simultaneously considering multiple parameters. Furthermore, the sensitivity of substrate noise to these parameters is evaluated, demonstrating the nonmonotonic dependence of noise on rise time. The design implications of the proposed analysis are discussed, identifying the preferred noise reduction technique for a specific set of operating points.
ISSN:1063-8210
1557-9999
DOI:10.1109/TVLSI.2008.2005195