Single-Event Upsets in Photoreceivers for Multi-Gb/s SLHC Data Transmission

A 63 MeV proton beam was used to perform a single event upset (SEU) test on a candidate component for a future high luminosity large hadron collider (HL-LHC) high speed optical. An in-lab error injector was used to show that 1-0 bit errors are caused by the amplifier's response to the large sig...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 2011-12, Vol.58 (6), p.3111-3117
Main Authors: El Nasr-Storey, S. S., Detraz, S., Ping Gui, Menouni, M., Moreira, P., Papadopoulos, S., Sigaud, C., Soos, C., Stejskal, P., Troska, J., Vasey, F.
Format: Article
Language:English
Subjects:
Errors
Hadrons
High speed
High speed optical links
Histograms
Injectors
Large Hadron Collider
LHC
Luminosity
Optical fiber communication
Particle beams
Photodiodes
Proton beams
Receivers
Single event upset
Single event upsets
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Description
Summary:A 63 MeV proton beam was used to perform a single event upset (SEU) test on a candidate component for a future high luminosity large hadron collider (HL-LHC) high speed optical. An in-lab error injector was used to show that 1-0 bit errors are caused by the amplifier's response to the large signal caused by a single event transient (SET) in the photodiode.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2011.2172632