Dielectric characteristics of spin-coated dielectric films using on-wafer parallel-plate capacitors at microwave frequencies

• Published in: IEEE transactions on dielectrics and electrical insulation 2005-12, Vol.12 (6), p.1151-1161
• Main Authors: Al-Omari, A.N., Lear, K.L.
• Format: Article
• Language: English
• Subjects: Capacitors; Dielectric devices; Dielectric films; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency measurement; Microwave frequencies; Microwave measurements; Permittivity measurement
• ISSN: 1070-9878; 1558-4135
• DOI: 10.1109/TDEI.2005.1561795

Dielectric properties of spin-coated dielectric insulators suitable for high-speed device fabrication are investigated. Complex dielectric permittivities and tangential losses of two polyimides, bisbenzocyclobutene (BCB), and a spin-on-glass (SOG) were extracted from the measured microwave reflection coefficient, S/sub 11/, of parallel-plate capacitors over a frequency range of 50 MHz to 40 GHz. A model for the dielectric permittivity as a function of frequency is developed based on measured data with a minimum square error of less than 10/sup -4/ between measured and modeled microwave reflection coefficients. A circuit model for the pad capacitance is obtained based on geometrical and physical considerations. The relationship between the dielectric loss and its thickness is considered. Experimental results are fitted to Debye and Cole-Cole models.