Using surface charge analysis to characterize the radiation response of Si/SiO2 structures

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Bibliographic Details
Published in:IEEE transactions on nuclear science 2004-12, Vol.51 (6), p.3686
Main Authors: Stacey, J.W, Schrimpf, R.D, Fleetwood, D.M, Holmes, K.C
Format: Article
Language:English
Online Access:Get full text
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ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2004.839259