Loading…
Improving the critical current density in Bi-2223 wires via a reduction of the secondary phase content
Progress in the performance of multifilamentary composite Bi-2223 wire fabricated at American Superconductor is reviewed. Critical current (I/sub c/) performance of 175 A at 77 K and self-field and critical current density (J/sub c/) performance of 22.1 kA/cm/sup 2/ (77 K, 0.1 T perpendicular to the...
Saved in:
Published in: | IEEE transactions on applied superconductivity 2003-06, Vol.13 (2), p.3038-3041 |
---|---|
Main Authors: | , , , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c457t-5bd33edc7afc1ddb9cc9dbfb576b3204842613747ddf720f096084338aef3e563 |
---|---|
cites | cdi_FETCH-LOGICAL-c457t-5bd33edc7afc1ddb9cc9dbfb576b3204842613747ddf720f096084338aef3e563 |
container_end_page | 3041 |
container_issue | 2 |
container_start_page | 3038 |
container_title | IEEE transactions on applied superconductivity |
container_volume | 13 |
creator | Huang, Y.B. Cai, X.Y. Holesinger, T. Maroni, V.A. Yu, D. Parrella, R. Rupich, M. Hellstrom, E. Teplitsky, M. Venkataraman, K. Otto, A. Larbalestier, D. |
description | Progress in the performance of multifilamentary composite Bi-2223 wire fabricated at American Superconductor is reviewed. Critical current (I/sub c/) performance of 175 A at 77 K and self-field and critical current density (J/sub c/) performance of 22.1 kA/cm/sup 2/ (77 K, 0.1 T perpendicular to the tape plane) have been measured for short samples of Bi-2223 wire (standard size is 0.21/spl times/4.0/spl times/100 mm). Microstructure analysis by SQUID magnetometry, transmission XRD and TEM shows a large amount of residual 2212 intergrowth remaining in Bi-2223 grains. Residual 2212 intergrowth is seen to correlate with self-field J/sub c/ at 77 K across a range of experimental samples, suggesting that higher levels of performance will be achieved by further reducing residual 2212. |
doi_str_mv | 10.1109/TASC.2003.812067 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_921509650</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1212263</ieee_id><sourcerecordid>28398360</sourcerecordid><originalsourceid>FETCH-LOGICAL-c457t-5bd33edc7afc1ddb9cc9dbfb576b3204842613747ddf720f096084338aef3e563</originalsourceid><addsrcrecordid>eNpdkMtLAzEQhxdRsFbvgpcg6G1rHpt9HLX4KBQ8WM8hm0xsyjZbk91K_3uztlDwNAPzzcfML0muCZ4QgquHxePHdEIxZpOSUJwXJ8mIcF6mlBN-GnvMSVpSys6TixBWGJOszPgoMbP1xrdb675QtwSkvO2skg1SvffgOqTBBdvtkHXoyaY0CtCP9RDQ1kokkQfdq862DrXmTxBAtU5Lv0ObpQxR2Louei6TMyObAFeHOk4-X54X07d0_v46mz7OU5Xxokt5rRkDrQppFNG6rpSqdG1qXuQ1ozieTHPCiqzQ2hQUG1zluMwYKyUYBjxn4-R-741PffcQOrG2QUHTSAdtHwQtWVWyHEfw9h-4anvv4m2iooRHMR8gvIeUb0PwYMTG23V8ThAshtTFkLoYUhf71OPK3cErQ8zReOmUDcc9jgvKOI3czZ6zAHAcU0Jpztgv6YuKbQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>921509650</pqid></control><display><type>article</type><title>Improving the critical current density in Bi-2223 wires via a reduction of the secondary phase content</title><source>IEEE Xplore (Online service)</source><creator>Huang, Y.B. ; Cai, X.Y. ; Holesinger, T. ; Maroni, V.A. ; Yu, D. ; Parrella, R. ; Rupich, M. ; Hellstrom, E. ; Teplitsky, M. ; Venkataraman, K. ; Otto, A. ; Larbalestier, D.</creator><creatorcontrib>Huang, Y.B. ; Cai, X.Y. ; Holesinger, T. ; Maroni, V.A. ; Yu, D. ; Parrella, R. ; Rupich, M. ; Hellstrom, E. ; Teplitsky, M. ; Venkataraman, K. ; Otto, A. ; Larbalestier, D.</creatorcontrib><description>Progress in the performance of multifilamentary composite Bi-2223 wire fabricated at American Superconductor is reviewed. Critical current (I/sub c/) performance of 175 A at 77 K and self-field and critical current density (J/sub c/) performance of 22.1 kA/cm/sup 2/ (77 K, 0.1 T perpendicular to the tape plane) have been measured for short samples of Bi-2223 wire (standard size is 0.21/spl times/4.0/spl times/100 mm). Microstructure analysis by SQUID magnetometry, transmission XRD and TEM shows a large amount of residual 2212 intergrowth remaining in Bi-2223 grains. Residual 2212 intergrowth is seen to correlate with self-field J/sub c/ at 77 K across a range of experimental samples, suggesting that higher levels of performance will be achieved by further reducing residual 2212.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/TASC.2003.812067</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Bi-based cuprates ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Critical current ; Critical current density ; Cuprates superconductors (high tc and insulating parent compounds) ; Current measurement ; Density measurement ; Electrical engineering. Electrical power engineering ; Exact sciences and technology ; Materials ; Measurement standards ; Microstructure ; Multifilamentary superconductors ; Physics ; Size measurement ; Superconducting filaments and wires ; Superconducting films ; Superconductivity</subject><ispartof>IEEE transactions on applied superconductivity, 2003-06, Vol.13 (2), p.3038-3041</ispartof><rights>2003 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2003</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c457t-5bd33edc7afc1ddb9cc9dbfb576b3204842613747ddf720f096084338aef3e563</citedby><cites>FETCH-LOGICAL-c457t-5bd33edc7afc1ddb9cc9dbfb576b3204842613747ddf720f096084338aef3e563</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1212263$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,23910,23911,25119,27903,27904,54775</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=15072352$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Huang, Y.B.</creatorcontrib><creatorcontrib>Cai, X.Y.</creatorcontrib><creatorcontrib>Holesinger, T.</creatorcontrib><creatorcontrib>Maroni, V.A.</creatorcontrib><creatorcontrib>Yu, D.</creatorcontrib><creatorcontrib>Parrella, R.</creatorcontrib><creatorcontrib>Rupich, M.</creatorcontrib><creatorcontrib>Hellstrom, E.</creatorcontrib><creatorcontrib>Teplitsky, M.</creatorcontrib><creatorcontrib>Venkataraman, K.</creatorcontrib><creatorcontrib>Otto, A.</creatorcontrib><creatorcontrib>Larbalestier, D.</creatorcontrib><title>Improving the critical current density in Bi-2223 wires via a reduction of the secondary phase content</title><title>IEEE transactions on applied superconductivity</title><addtitle>TASC</addtitle><description>Progress in the performance of multifilamentary composite Bi-2223 wire fabricated at American Superconductor is reviewed. Critical current (I/sub c/) performance of 175 A at 77 K and self-field and critical current density (J/sub c/) performance of 22.1 kA/cm/sup 2/ (77 K, 0.1 T perpendicular to the tape plane) have been measured for short samples of Bi-2223 wire (standard size is 0.21/spl times/4.0/spl times/100 mm). Microstructure analysis by SQUID magnetometry, transmission XRD and TEM shows a large amount of residual 2212 intergrowth remaining in Bi-2223 grains. Residual 2212 intergrowth is seen to correlate with self-field J/sub c/ at 77 K across a range of experimental samples, suggesting that higher levels of performance will be achieved by further reducing residual 2212.</description><subject>Applied sciences</subject><subject>Bi-based cuprates</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Critical current</subject><subject>Critical current density</subject><subject>Cuprates superconductors (high tc and insulating parent compounds)</subject><subject>Current measurement</subject><subject>Density measurement</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Exact sciences and technology</subject><subject>Materials</subject><subject>Measurement standards</subject><subject>Microstructure</subject><subject>Multifilamentary superconductors</subject><subject>Physics</subject><subject>Size measurement</subject><subject>Superconducting filaments and wires</subject><subject>Superconducting films</subject><subject>Superconductivity</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNpdkMtLAzEQhxdRsFbvgpcg6G1rHpt9HLX4KBQ8WM8hm0xsyjZbk91K_3uztlDwNAPzzcfML0muCZ4QgquHxePHdEIxZpOSUJwXJ8mIcF6mlBN-GnvMSVpSys6TixBWGJOszPgoMbP1xrdb675QtwSkvO2skg1SvffgOqTBBdvtkHXoyaY0CtCP9RDQ1kokkQfdq862DrXmTxBAtU5Lv0ObpQxR2Louei6TMyObAFeHOk4-X54X07d0_v46mz7OU5Xxokt5rRkDrQppFNG6rpSqdG1qXuQ1ozieTHPCiqzQ2hQUG1zluMwYKyUYBjxn4-R-741PffcQOrG2QUHTSAdtHwQtWVWyHEfw9h-4anvv4m2iooRHMR8gvIeUb0PwYMTG23V8ThAshtTFkLoYUhf71OPK3cErQ8zReOmUDcc9jgvKOI3czZ6zAHAcU0Jpztgv6YuKbQ</recordid><startdate>20030601</startdate><enddate>20030601</enddate><creator>Huang, Y.B.</creator><creator>Cai, X.Y.</creator><creator>Holesinger, T.</creator><creator>Maroni, V.A.</creator><creator>Yu, D.</creator><creator>Parrella, R.</creator><creator>Rupich, M.</creator><creator>Hellstrom, E.</creator><creator>Teplitsky, M.</creator><creator>Venkataraman, K.</creator><creator>Otto, A.</creator><creator>Larbalestier, D.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20030601</creationdate><title>Improving the critical current density in Bi-2223 wires via a reduction of the secondary phase content</title><author>Huang, Y.B. ; Cai, X.Y. ; Holesinger, T. ; Maroni, V.A. ; Yu, D. ; Parrella, R. ; Rupich, M. ; Hellstrom, E. ; Teplitsky, M. ; Venkataraman, K. ; Otto, A. ; Larbalestier, D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c457t-5bd33edc7afc1ddb9cc9dbfb576b3204842613747ddf720f096084338aef3e563</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Applied sciences</topic><topic>Bi-based cuprates</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Critical current</topic><topic>Critical current density</topic><topic>Cuprates superconductors (high tc and insulating parent compounds)</topic><topic>Current measurement</topic><topic>Density measurement</topic><topic>Electrical engineering. Electrical power engineering</topic><topic>Exact sciences and technology</topic><topic>Materials</topic><topic>Measurement standards</topic><topic>Microstructure</topic><topic>Multifilamentary superconductors</topic><topic>Physics</topic><topic>Size measurement</topic><topic>Superconducting filaments and wires</topic><topic>Superconducting films</topic><topic>Superconductivity</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Huang, Y.B.</creatorcontrib><creatorcontrib>Cai, X.Y.</creatorcontrib><creatorcontrib>Holesinger, T.</creatorcontrib><creatorcontrib>Maroni, V.A.</creatorcontrib><creatorcontrib>Yu, D.</creatorcontrib><creatorcontrib>Parrella, R.</creatorcontrib><creatorcontrib>Rupich, M.</creatorcontrib><creatorcontrib>Hellstrom, E.</creatorcontrib><creatorcontrib>Teplitsky, M.</creatorcontrib><creatorcontrib>Venkataraman, K.</creatorcontrib><creatorcontrib>Otto, A.</creatorcontrib><creatorcontrib>Larbalestier, D.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE/IET Electronic Library</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on applied superconductivity</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Huang, Y.B.</au><au>Cai, X.Y.</au><au>Holesinger, T.</au><au>Maroni, V.A.</au><au>Yu, D.</au><au>Parrella, R.</au><au>Rupich, M.</au><au>Hellstrom, E.</au><au>Teplitsky, M.</au><au>Venkataraman, K.</au><au>Otto, A.</au><au>Larbalestier, D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Improving the critical current density in Bi-2223 wires via a reduction of the secondary phase content</atitle><jtitle>IEEE transactions on applied superconductivity</jtitle><stitle>TASC</stitle><date>2003-06-01</date><risdate>2003</risdate><volume>13</volume><issue>2</issue><spage>3038</spage><epage>3041</epage><pages>3038-3041</pages><issn>1051-8223</issn><eissn>1558-2515</eissn><coden>ITASE9</coden><abstract>Progress in the performance of multifilamentary composite Bi-2223 wire fabricated at American Superconductor is reviewed. Critical current (I/sub c/) performance of 175 A at 77 K and self-field and critical current density (J/sub c/) performance of 22.1 kA/cm/sup 2/ (77 K, 0.1 T perpendicular to the tape plane) have been measured for short samples of Bi-2223 wire (standard size is 0.21/spl times/4.0/spl times/100 mm). Microstructure analysis by SQUID magnetometry, transmission XRD and TEM shows a large amount of residual 2212 intergrowth remaining in Bi-2223 grains. Residual 2212 intergrowth is seen to correlate with self-field J/sub c/ at 77 K across a range of experimental samples, suggesting that higher levels of performance will be achieved by further reducing residual 2212.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TASC.2003.812067</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1051-8223 |
ispartof | IEEE transactions on applied superconductivity, 2003-06, Vol.13 (2), p.3038-3041 |
issn | 1051-8223 1558-2515 |
language | eng |
recordid | cdi_proquest_journals_921509650 |
source | IEEE Xplore (Online service) |
subjects | Applied sciences Bi-based cuprates Condensed matter: electronic structure, electrical, magnetic, and optical properties Critical current Critical current density Cuprates superconductors (high tc and insulating parent compounds) Current measurement Density measurement Electrical engineering. Electrical power engineering Exact sciences and technology Materials Measurement standards Microstructure Multifilamentary superconductors Physics Size measurement Superconducting filaments and wires Superconducting films Superconductivity |
title | Improving the critical current density in Bi-2223 wires via a reduction of the secondary phase content |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-21T16%3A04%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Improving%20the%20critical%20current%20density%20in%20Bi-2223%20wires%20via%20a%20reduction%20of%20the%20secondary%20phase%20content&rft.jtitle=IEEE%20transactions%20on%20applied%20superconductivity&rft.au=Huang,%20Y.B.&rft.date=2003-06-01&rft.volume=13&rft.issue=2&rft.spage=3038&rft.epage=3041&rft.pages=3038-3041&rft.issn=1051-8223&rft.eissn=1558-2515&rft.coden=ITASE9&rft_id=info:doi/10.1109/TASC.2003.812067&rft_dat=%3Cproquest_cross%3E28398360%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c457t-5bd33edc7afc1ddb9cc9dbfb576b3204842613747ddf720f096084338aef3e563%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=921509650&rft_id=info:pmid/&rft_ieee_id=1212263&rfr_iscdi=true |