Random telegraph voltage noise in a Bi2Sr2CaCu2O8+x intrinsic Josephson junction

Large random telegraph voltage noises (RTVN) were only detected for low bias current region of the BSCCO mesa for current biased on the 4th (Ib=6.0 mA) and 5th (Ib=5.0 mA) resistive-branches, and also not observed for all of voltage region at 4.2 K and low bias voltage region, from 1st to 3rd resist...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2001-03, Vol.11 (1), p.304-307
Main Authors: SAITO, Atsushi, HAMASAKI, Katsuyoshi, IRIE, Akinobu, OYA, Gin-Ichiro
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Noise
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Superconducting devices
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Summary:Large random telegraph voltage noises (RTVN) were only detected for low bias current region of the BSCCO mesa for current biased on the 4th (Ib=6.0 mA) and 5th (Ib=5.0 mA) resistive-branches, and also not observed for all of voltage region at 4.2 K and low bias voltage region, from 1st to 3rd resistive-branches, at 36 K. The measured Sv(f) had the Lorentzian frequency dependence, as expected from the Machlup formula for random telegraph signal.
ISSN:1051-8223
1558-2515
DOI:10.1109/77.919344