SIMS Analysis of Zircaloy Cladding and Ion Implanted UO2: First Results

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

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Bibliographic Details
Published in:Microscopy and microanalysis 2006-08, Vol.12 (S02), p.848-849
Main Authors: Walker, CT, Brémier, S, Portier, S
Format: Article
Language:English
Subjects:
Agreements
Boron
Ion beams
Lithium
Microscopy
Quantitative X-ray Microanalysis: A Symposium Honoring Art Chodos
Online Access:Get full text
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
ISSN:1431-9276
1435-8115
DOI:10.1017/S143192760606137X