Loading…

Estimation for the parameters in the step-up voltage test under the weibull power law model

In assessing the insulation withstand level of the electric power apparatus, the step-up test method is used. However, there are still many unknown matters regarding the treatment of the results. In this paper, we assume that the underlying probability distribution of failure time with a constant vo...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on dielectrics and electrical insulation 2009-12, Vol.16 (6), p.1755-1760
Main Authors: Hirose, H., Tsuru, K., Tsuboi, T., Okabe, S.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c423t-a773c6cd5394bb2633d5dcdbc5b271437f5019abc354c3603b8401918d11c4b43
cites cdi_FETCH-LOGICAL-c423t-a773c6cd5394bb2633d5dcdbc5b271437f5019abc354c3603b8401918d11c4b43
container_end_page 1760
container_issue 6
container_start_page 1755
container_title IEEE transactions on dielectrics and electrical insulation
container_volume 16
creator Hirose, H.
Tsuru, K.
Tsuboi, T.
Okabe, S.
description In assessing the insulation withstand level of the electric power apparatus, the step-up test method is used. However, there are still many unknown matters regarding the treatment of the results. In this paper, we assume that the underlying probability distribution of failure time with a constant voltage level follows a Weibull distribution and that there is an inverse power law relationship between the mean lifetime and the imposed voltage, that is, the Weibull power law holds. Under such a condition, we investigate whether we can estimate the unknown parameters using the results obtained by the step-up test. In dealing with the step-up test data, we assume two models: the cumulative exposure model (CEM) and the independence model (IM). In parameter estimation, we use two methods: the maximum likelihood estimation (MLE) method and the method of least squares (LS). The estimates obtained by using the MLE have markedly smaller estimating errors than those by using the LS in both the models of the CEM and IM. While the MLE has a property of the consistency, the LS does not have it. In applying the CEM we can obtain the power law constant and the Weibull shape parameter simultaneously; however, in applying the IM, we cannot do that.
doi_str_mv 10.1109/TDEI.2009.5361599
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1010884248</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5361599</ieee_id><sourcerecordid>818836863</sourcerecordid><originalsourceid>FETCH-LOGICAL-c423t-a773c6cd5394bb2633d5dcdbc5b271437f5019abc354c3603b8401918d11c4b43</originalsourceid><addsrcrecordid>eNp9kTFPwzAUhC0EEiXwAxCLxQJLil9sJ86ISoFKlVjKxBA5jgOp0jjYDhX_HpcUBgYmW-fvTs_vEDoHMgUg-c3qbr6YJoTkU05T4Hl-gCbAuYgZUH4Y7iQjcS4ycYxOnFsTAown6QS9zJ1vNtI3psO1sdi_adxLKzfaa-tw030rzus-Hnr8YVovXzX22nk8dJUeDVvdlEPb4t5sg9LKLd6YSren6KiWrdNn-zNCz_fz1ewxXj49LGa3y1ixhPpYZhlVqao4zVlZJimlFa9UVSpeJhkwmtWcQC5LRTlTNCW0FCwIICoAxUpGI3Q15vbWvA9htGLTOKXbVnbaDK4QIARNRQiO0PW_JBAgQrCEiYBe_kHXZrBd-EeRQ0IFhbDZCMEIKWucs7ouehu2aT9DUrHrpdj1Uux6Kfa9BM_F6Gm01r_8z-sX33WIPw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>912383141</pqid></control><display><type>article</type><title>Estimation for the parameters in the step-up voltage test under the weibull power law model</title><source>IEEE Xplore (Online service)</source><creator>Hirose, H. ; Tsuru, K. ; Tsuboi, T. ; Okabe, S.</creator><creatorcontrib>Hirose, H. ; Tsuru, K. ; Tsuboi, T. ; Okabe, S.</creatorcontrib><description>In assessing the insulation withstand level of the electric power apparatus, the step-up test method is used. However, there are still many unknown matters regarding the treatment of the results. In this paper, we assume that the underlying probability distribution of failure time with a constant voltage level follows a Weibull distribution and that there is an inverse power law relationship between the mean lifetime and the imposed voltage, that is, the Weibull power law holds. Under such a condition, we investigate whether we can estimate the unknown parameters using the results obtained by the step-up test. In dealing with the step-up test data, we assume two models: the cumulative exposure model (CEM) and the independence model (IM). In parameter estimation, we use two methods: the maximum likelihood estimation (MLE) method and the method of least squares (LS). The estimates obtained by using the MLE have markedly smaller estimating errors than those by using the LS in both the models of the CEM and IM. While the MLE has a property of the consistency, the LS does not have it. In applying the CEM we can obtain the power law constant and the Weibull shape parameter simultaneously; however, in applying the IM, we cannot do that.</description><identifier>ISSN: 1070-9878</identifier><identifier>EISSN: 1558-4135</identifier><identifier>DOI: 10.1109/TDEI.2009.5361599</identifier><identifier>CODEN: ITDIES</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Breakdown voltage ; cumulative exposure model ; Dielectrics and electrical insulation ; Electric potential ; Estimates ; Estimating ; Failure times ; independence model ; Insulation ; Insulation testing ; Least squares approximation ; Mathematical models ; Maximum likelihood estimation ; method of least squares ; Parameter estimation ; Power law ; Probability distribution ; Shape ; Step-up voltage test ; Stress ; Studies ; Voltage ; Weibull distribution ; Weibull power law</subject><ispartof>IEEE transactions on dielectrics and electrical insulation, 2009-12, Vol.16 (6), p.1755-1760</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2009</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c423t-a773c6cd5394bb2633d5dcdbc5b271437f5019abc354c3603b8401918d11c4b43</citedby><cites>FETCH-LOGICAL-c423t-a773c6cd5394bb2633d5dcdbc5b271437f5019abc354c3603b8401918d11c4b43</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5361599$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids></links><search><creatorcontrib>Hirose, H.</creatorcontrib><creatorcontrib>Tsuru, K.</creatorcontrib><creatorcontrib>Tsuboi, T.</creatorcontrib><creatorcontrib>Okabe, S.</creatorcontrib><title>Estimation for the parameters in the step-up voltage test under the weibull power law model</title><title>IEEE transactions on dielectrics and electrical insulation</title><addtitle>T-DEI</addtitle><description>In assessing the insulation withstand level of the electric power apparatus, the step-up test method is used. However, there are still many unknown matters regarding the treatment of the results. In this paper, we assume that the underlying probability distribution of failure time with a constant voltage level follows a Weibull distribution and that there is an inverse power law relationship between the mean lifetime and the imposed voltage, that is, the Weibull power law holds. Under such a condition, we investigate whether we can estimate the unknown parameters using the results obtained by the step-up test. In dealing with the step-up test data, we assume two models: the cumulative exposure model (CEM) and the independence model (IM). In parameter estimation, we use two methods: the maximum likelihood estimation (MLE) method and the method of least squares (LS). The estimates obtained by using the MLE have markedly smaller estimating errors than those by using the LS in both the models of the CEM and IM. While the MLE has a property of the consistency, the LS does not have it. In applying the CEM we can obtain the power law constant and the Weibull shape parameter simultaneously; however, in applying the IM, we cannot do that.</description><subject>Breakdown voltage</subject><subject>cumulative exposure model</subject><subject>Dielectrics and electrical insulation</subject><subject>Electric potential</subject><subject>Estimates</subject><subject>Estimating</subject><subject>Failure times</subject><subject>independence model</subject><subject>Insulation</subject><subject>Insulation testing</subject><subject>Least squares approximation</subject><subject>Mathematical models</subject><subject>Maximum likelihood estimation</subject><subject>method of least squares</subject><subject>Parameter estimation</subject><subject>Power law</subject><subject>Probability distribution</subject><subject>Shape</subject><subject>Step-up voltage test</subject><subject>Stress</subject><subject>Studies</subject><subject>Voltage</subject><subject>Weibull distribution</subject><subject>Weibull power law</subject><issn>1070-9878</issn><issn>1558-4135</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNp9kTFPwzAUhC0EEiXwAxCLxQJLil9sJ86ISoFKlVjKxBA5jgOp0jjYDhX_HpcUBgYmW-fvTs_vEDoHMgUg-c3qbr6YJoTkU05T4Hl-gCbAuYgZUH4Y7iQjcS4ycYxOnFsTAown6QS9zJ1vNtI3psO1sdi_adxLKzfaa-tw030rzus-Hnr8YVovXzX22nk8dJUeDVvdlEPb4t5sg9LKLd6YSren6KiWrdNn-zNCz_fz1ewxXj49LGa3y1ixhPpYZhlVqao4zVlZJimlFa9UVSpeJhkwmtWcQC5LRTlTNCW0FCwIICoAxUpGI3Q15vbWvA9htGLTOKXbVnbaDK4QIARNRQiO0PW_JBAgQrCEiYBe_kHXZrBd-EeRQ0IFhbDZCMEIKWucs7ouehu2aT9DUrHrpdj1Uux6Kfa9BM_F6Gm01r_8z-sX33WIPw</recordid><startdate>20091201</startdate><enddate>20091201</enddate><creator>Hirose, H.</creator><creator>Tsuru, K.</creator><creator>Tsuboi, T.</creator><creator>Okabe, S.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20091201</creationdate><title>Estimation for the parameters in the step-up voltage test under the weibull power law model</title><author>Hirose, H. ; Tsuru, K. ; Tsuboi, T. ; Okabe, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c423t-a773c6cd5394bb2633d5dcdbc5b271437f5019abc354c3603b8401918d11c4b43</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Breakdown voltage</topic><topic>cumulative exposure model</topic><topic>Dielectrics and electrical insulation</topic><topic>Electric potential</topic><topic>Estimates</topic><topic>Estimating</topic><topic>Failure times</topic><topic>independence model</topic><topic>Insulation</topic><topic>Insulation testing</topic><topic>Least squares approximation</topic><topic>Mathematical models</topic><topic>Maximum likelihood estimation</topic><topic>method of least squares</topic><topic>Parameter estimation</topic><topic>Power law</topic><topic>Probability distribution</topic><topic>Shape</topic><topic>Step-up voltage test</topic><topic>Stress</topic><topic>Studies</topic><topic>Voltage</topic><topic>Weibull distribution</topic><topic>Weibull power law</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hirose, H.</creatorcontrib><creatorcontrib>Tsuru, K.</creatorcontrib><creatorcontrib>Tsuboi, T.</creatorcontrib><creatorcontrib>Okabe, S.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Xplore</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on dielectrics and electrical insulation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hirose, H.</au><au>Tsuru, K.</au><au>Tsuboi, T.</au><au>Okabe, S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Estimation for the parameters in the step-up voltage test under the weibull power law model</atitle><jtitle>IEEE transactions on dielectrics and electrical insulation</jtitle><stitle>T-DEI</stitle><date>2009-12-01</date><risdate>2009</risdate><volume>16</volume><issue>6</issue><spage>1755</spage><epage>1760</epage><pages>1755-1760</pages><issn>1070-9878</issn><eissn>1558-4135</eissn><coden>ITDIES</coden><abstract>In assessing the insulation withstand level of the electric power apparatus, the step-up test method is used. However, there are still many unknown matters regarding the treatment of the results. In this paper, we assume that the underlying probability distribution of failure time with a constant voltage level follows a Weibull distribution and that there is an inverse power law relationship between the mean lifetime and the imposed voltage, that is, the Weibull power law holds. Under such a condition, we investigate whether we can estimate the unknown parameters using the results obtained by the step-up test. In dealing with the step-up test data, we assume two models: the cumulative exposure model (CEM) and the independence model (IM). In parameter estimation, we use two methods: the maximum likelihood estimation (MLE) method and the method of least squares (LS). The estimates obtained by using the MLE have markedly smaller estimating errors than those by using the LS in both the models of the CEM and IM. While the MLE has a property of the consistency, the LS does not have it. In applying the CEM we can obtain the power law constant and the Weibull shape parameter simultaneously; however, in applying the IM, we cannot do that.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TDEI.2009.5361599</doi><tpages>6</tpages></addata></record>
fulltext fulltext
identifier ISSN: 1070-9878
ispartof IEEE transactions on dielectrics and electrical insulation, 2009-12, Vol.16 (6), p.1755-1760
issn 1070-9878
1558-4135
language eng
recordid cdi_proquest_miscellaneous_1010884248
source IEEE Xplore (Online service)
subjects Breakdown voltage
cumulative exposure model
Dielectrics and electrical insulation
Electric potential
Estimates
Estimating
Failure times
independence model
Insulation
Insulation testing
Least squares approximation
Mathematical models
Maximum likelihood estimation
method of least squares
Parameter estimation
Power law
Probability distribution
Shape
Step-up voltage test
Stress
Studies
Voltage
Weibull distribution
Weibull power law
title Estimation for the parameters in the step-up voltage test under the weibull power law model
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T03%3A28%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Estimation%20for%20the%20parameters%20in%20the%20step-up%20voltage%20test%20under%20the%20weibull%20power%20law%20model&rft.jtitle=IEEE%20transactions%20on%20dielectrics%20and%20electrical%20insulation&rft.au=Hirose,%20H.&rft.date=2009-12-01&rft.volume=16&rft.issue=6&rft.spage=1755&rft.epage=1760&rft.pages=1755-1760&rft.issn=1070-9878&rft.eissn=1558-4135&rft.coden=ITDIES&rft_id=info:doi/10.1109/TDEI.2009.5361599&rft_dat=%3Cproquest_cross%3E818836863%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c423t-a773c6cd5394bb2633d5dcdbc5b271437f5019abc354c3603b8401918d11c4b43%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=912383141&rft_id=info:pmid/&rft_ieee_id=5361599&rfr_iscdi=true