Performance of a TiN-coated monolithic silicon pin-diode array under mechanical stress

The Karlsruhe Tritium Neutrino Experiment (KATRIN) will detect tritium β-decay electrons that pass through its electromagnetic spectrometer with a highly segmented monolithic silicon pin-diode focal-plane detector (FPD). This pin-diode array will be on a single piece of 500-μm-thick silicon, with co...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2012-05, Vol.673, p.46-50
Main Authors: VanDevender, B.A., Bodine, L.I., Myers, A.W., Amsbaugh, J.F., Howe, M.A., Leber, M.L., Robertson, R.G.H., Tolich, K., Van Wechel, T.D., Wall, B.L.
Format: Article
Language:English
Subjects:
Arrays
Contact
Detectors
Leakage current
Mechanical stress
Pin diode
POGO
Pogo pin
Silicon
Spectrometers
Stresses
Titanium nitride
Tritium
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Summary:The Karlsruhe Tritium Neutrino Experiment (KATRIN) will detect tritium β-decay electrons that pass through its electromagnetic spectrometer with a highly segmented monolithic silicon pin-diode focal-plane detector (FPD). This pin-diode array will be on a single piece of 500-μm-thick silicon, with contact between titanium nitride (TiN)-coated detector pixels and front-end electronics made by spring-loaded pogo pins. The pogo pins will exert a total force of up to 50N on the detector, deforming it and resulting in mechanical stress up to 50MPa in the silicon bulk. We have evaluated a prototype pin-diode array with a pogo-pin connection scheme similar to the KATRIN FPD. We find that pogo pins make good electrical contact to TiN and observe no effects on detector resolution or reverse-bias leakage current which can be attributed to mechanical stress.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2012.01.033