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Maintenance of stable light emission in high power LEDs
As well known, the light emission characteristics of the high power light-emitting diodes (LEDs) are very sensitive to the various driving conditions, especially the injected electric current and the junction temperature in operation. In this work, the dependency of the emission light from high powe...
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Published in: | Microelectronics and reliability 2012-05, Vol.52 (5), p.912-915 |
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creator | Chou, Hung-Yu Chen, Cheng-Chien Yang, Tsung-Hsun |
description | As well known, the light emission characteristics of the high power light-emitting diodes (LEDs) are very sensitive to the various driving conditions, especially the injected electric current and the junction temperature in operation. In this work, the dependency of the emission light from high power LEDs upon the driving electric current and the junction temperature will be explored in details. One integrated measurement system is proposed for the study in simultaneously obtaining all the thermal–optic–electric characteristics of LEDs throughout the measuring. Based on the basic feedback control methodology, one simple maintaining procedure is applied for the stable light emission in high power LEDs. It shows the robustness of the maintaining procedure from the environment change with the least heat dissipation in the operation of the high power LEDs. The results imply that all the thermal, the optic, and the electric properties of the high power LEDs should be taken into consideration in the same time rather than separately when maintaining their operation. |
doi_str_mv | 10.1016/j.microrel.2012.02.002 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1022853655</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0026271412000376</els_id><sourcerecordid>1022853655</sourcerecordid><originalsourceid>FETCH-LOGICAL-c345t-7021a3b7c03f70d20351b7806367e943904110c689197525696d1a086e266c263</originalsourceid><addsrcrecordid>eNqFkE9LxDAQxYMouK5-BcnRS-tM0ibtTVn_wooXBW8hm07dLN12TbqK394sq2dhYODx3mPmx9g5Qo6A6nKVr70LQ6AuF4AihzQgDtgEKy2yusC3QzZJisqExuKYncS4AgANiBOmn6zvR-pt74gPLY-jXXTEO_--HDmtfYx-6Lnv-TIpfDN8UeDz25t4yo5a20U6-91T9np3-zJ7yObP94-z63nmZFGOmQaBVi60A9lqaATIEhe6AiWVprqQNRSI4FRVY61LUapaNWihUiSUckLJKbvY927C8LGlOJp0k6Ousz0N22gQhKhKqcoyWdXemmDEGKg1m-DXNnwnk9mRMivzR8rsSBlIAyIFr_ZBSo98egomOk8JSOMDudE0g_-v4gf6pHIG</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1022853655</pqid></control><display><type>article</type><title>Maintenance of stable light emission in high power LEDs</title><source>ScienceDirect Freedom Collection</source><creator>Chou, Hung-Yu ; Chen, Cheng-Chien ; Yang, Tsung-Hsun</creator><creatorcontrib>Chou, Hung-Yu ; Chen, Cheng-Chien ; Yang, Tsung-Hsun</creatorcontrib><description>As well known, the light emission characteristics of the high power light-emitting diodes (LEDs) are very sensitive to the various driving conditions, especially the injected electric current and the junction temperature in operation. In this work, the dependency of the emission light from high power LEDs upon the driving electric current and the junction temperature will be explored in details. One integrated measurement system is proposed for the study in simultaneously obtaining all the thermal–optic–electric characteristics of LEDs throughout the measuring. Based on the basic feedback control methodology, one simple maintaining procedure is applied for the stable light emission in high power LEDs. It shows the robustness of the maintaining procedure from the environment change with the least heat dissipation in the operation of the high power LEDs. The results imply that all the thermal, the optic, and the electric properties of the high power LEDs should be taken into consideration in the same time rather than separately when maintaining their operation.</description><identifier>ISSN: 0026-2714</identifier><identifier>EISSN: 1872-941X</identifier><identifier>DOI: 10.1016/j.microrel.2012.02.002</identifier><language>eng</language><publisher>Elsevier Ltd</publisher><subject>Driving conditions ; Electric current ; Electric power generation ; Electrical junctions ; Emission ; Light emission ; Maintenance ; Robustness</subject><ispartof>Microelectronics and reliability, 2012-05, Vol.52 (5), p.912-915</ispartof><rights>2012 Elsevier Ltd</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c345t-7021a3b7c03f70d20351b7806367e943904110c689197525696d1a086e266c263</citedby><cites>FETCH-LOGICAL-c345t-7021a3b7c03f70d20351b7806367e943904110c689197525696d1a086e266c263</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27915,27916</link.rule.ids></links><search><creatorcontrib>Chou, Hung-Yu</creatorcontrib><creatorcontrib>Chen, Cheng-Chien</creatorcontrib><creatorcontrib>Yang, Tsung-Hsun</creatorcontrib><title>Maintenance of stable light emission in high power LEDs</title><title>Microelectronics and reliability</title><description>As well known, the light emission characteristics of the high power light-emitting diodes (LEDs) are very sensitive to the various driving conditions, especially the injected electric current and the junction temperature in operation. In this work, the dependency of the emission light from high power LEDs upon the driving electric current and the junction temperature will be explored in details. One integrated measurement system is proposed for the study in simultaneously obtaining all the thermal–optic–electric characteristics of LEDs throughout the measuring. Based on the basic feedback control methodology, one simple maintaining procedure is applied for the stable light emission in high power LEDs. It shows the robustness of the maintaining procedure from the environment change with the least heat dissipation in the operation of the high power LEDs. The results imply that all the thermal, the optic, and the electric properties of the high power LEDs should be taken into consideration in the same time rather than separately when maintaining their operation.</description><subject>Driving conditions</subject><subject>Electric current</subject><subject>Electric power generation</subject><subject>Electrical junctions</subject><subject>Emission</subject><subject>Light emission</subject><subject>Maintenance</subject><subject>Robustness</subject><issn>0026-2714</issn><issn>1872-941X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNqFkE9LxDAQxYMouK5-BcnRS-tM0ibtTVn_wooXBW8hm07dLN12TbqK394sq2dhYODx3mPmx9g5Qo6A6nKVr70LQ6AuF4AihzQgDtgEKy2yusC3QzZJisqExuKYncS4AgANiBOmn6zvR-pt74gPLY-jXXTEO_--HDmtfYx-6Lnv-TIpfDN8UeDz25t4yo5a20U6-91T9np3-zJ7yObP94-z63nmZFGOmQaBVi60A9lqaATIEhe6AiWVprqQNRSI4FRVY61LUapaNWihUiSUckLJKbvY927C8LGlOJp0k6Ousz0N22gQhKhKqcoyWdXemmDEGKg1m-DXNnwnk9mRMivzR8rsSBlIAyIFr_ZBSo98egomOk8JSOMDudE0g_-v4gf6pHIG</recordid><startdate>201205</startdate><enddate>201205</enddate><creator>Chou, Hung-Yu</creator><creator>Chen, Cheng-Chien</creator><creator>Yang, Tsung-Hsun</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>201205</creationdate><title>Maintenance of stable light emission in high power LEDs</title><author>Chou, Hung-Yu ; Chen, Cheng-Chien ; Yang, Tsung-Hsun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c345t-7021a3b7c03f70d20351b7806367e943904110c689197525696d1a086e266c263</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Driving conditions</topic><topic>Electric current</topic><topic>Electric power generation</topic><topic>Electrical junctions</topic><topic>Emission</topic><topic>Light emission</topic><topic>Maintenance</topic><topic>Robustness</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chou, Hung-Yu</creatorcontrib><creatorcontrib>Chen, Cheng-Chien</creatorcontrib><creatorcontrib>Yang, Tsung-Hsun</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Microelectronics and reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Chou, Hung-Yu</au><au>Chen, Cheng-Chien</au><au>Yang, Tsung-Hsun</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Maintenance of stable light emission in high power LEDs</atitle><jtitle>Microelectronics and reliability</jtitle><date>2012-05</date><risdate>2012</risdate><volume>52</volume><issue>5</issue><spage>912</spage><epage>915</epage><pages>912-915</pages><issn>0026-2714</issn><eissn>1872-941X</eissn><abstract>As well known, the light emission characteristics of the high power light-emitting diodes (LEDs) are very sensitive to the various driving conditions, especially the injected electric current and the junction temperature in operation. In this work, the dependency of the emission light from high power LEDs upon the driving electric current and the junction temperature will be explored in details. One integrated measurement system is proposed for the study in simultaneously obtaining all the thermal–optic–electric characteristics of LEDs throughout the measuring. Based on the basic feedback control methodology, one simple maintaining procedure is applied for the stable light emission in high power LEDs. It shows the robustness of the maintaining procedure from the environment change with the least heat dissipation in the operation of the high power LEDs. The results imply that all the thermal, the optic, and the electric properties of the high power LEDs should be taken into consideration in the same time rather than separately when maintaining their operation.</abstract><pub>Elsevier Ltd</pub><doi>10.1016/j.microrel.2012.02.002</doi><tpages>4</tpages></addata></record> |
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subjects | Driving conditions Electric current Electric power generation Electrical junctions Emission Light emission Maintenance Robustness |
title | Maintenance of stable light emission in high power LEDs |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T06%3A40%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Maintenance%20of%20stable%20light%20emission%20in%20high%20power%20LEDs&rft.jtitle=Microelectronics%20and%20reliability&rft.au=Chou,%20Hung-Yu&rft.date=2012-05&rft.volume=52&rft.issue=5&rft.spage=912&rft.epage=915&rft.pages=912-915&rft.issn=0026-2714&rft.eissn=1872-941X&rft_id=info:doi/10.1016/j.microrel.2012.02.002&rft_dat=%3Cproquest_cross%3E1022853655%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c345t-7021a3b7c03f70d20351b7806367e943904110c689197525696d1a086e266c263%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1022853655&rft_id=info:pmid/&rfr_iscdi=true |