SIMS analytical technique for PV applications

This paper presents analytical performances provided by SIMS tools for the development and manufacture of new solar cells. Results for two main applications are presented: trace element analysis in PV (photovoltaic) Si feedstock with detection limits from the ppm down to the ppb range (depending on...

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Bibliographic Details
Published in:Surface and interface analysis 2011-01, Vol.43 (1-2), p.643-645
Main Authors: Peres, P., Merkulov, A., Desse, F., Schuhmacher, M.
Format: Article
Language:English
Subjects:
APPLICATIONS
Applied sciences
Atomic, molecular, and ion beam impact and interactions with surfaces
CIGS
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science
rheology
Electron and ion emission by liquids and solids
impact phenomena
Energy
Exact sciences and technology
Impact phenomena (including electron spectra and sputtering)
Interface analysis
MATHEMATICAL ANALYSIS
Natural energy
Photoelectric conversion: solar cells and arrays
Photovoltaic cells
Photovoltaic conversion
photovoltaic structures
Physics
pure material
Secondary ion mass spectrometry
Silicon
SIMS
SOLAR CELLS
Solar cells. Photoelectrochemical cells
Solar energy
THIN FILMS
Trace elements
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Description
Summary:This paper presents analytical performances provided by SIMS tools for the development and manufacture of new solar cells. Results for two main applications are presented: trace element analysis in PV (photovoltaic) Si feedstock with detection limits from the ppm down to the ppb range (depending on the species to be analyzed) for light elements (C, O, N), main Si dopants (B, P, As) and metals; indepth distribution of main components and trace elements in CIGS thin films. Copyright © 2010 John Wiley & Sons, Ltd.
ISSN:0142-2421
1096-9918
1096-9918
DOI:10.1002/sia.3525