Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment

A novel grazing‐incidence in‐plane X‐ray diffraction setup based on a commercial four‐circle diffractometer with a sealed‐ceramic copper X‐ray tube, upgraded with parabolic graded multilayer X‐ray optics and a one‐dimensional position‐sensitive detector, is presented. The high potential of this setu...

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Bibliographic Details
Published in:Journal of applied crystallography 2012-04, Vol.45 (2), p.367-370
Main Authors: Neuschitzer, Markus, Moser, Armin, Neuhold, Alfred, Kraxner, Johanna, Stadlober, Barbara, Oehzelt, Martin, Salzmann, Ingo, Resel, Roland, Novák, Jiří
Format: Article
Language:English
Subjects:
Ceramics
Crystallography
Diffraction
grazing-incidence in-plane X-ray diffraction
Lattice parameters
monolayers
Multilayers
Pentacene
Synchrotron radiation
Thin films
X-ray tubes
X-rays
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Summary:A novel grazing‐incidence in‐plane X‐ray diffraction setup based on a commercial four‐circle diffractometer with a sealed‐ceramic copper X‐ray tube, upgraded with parabolic graded multilayer X‐ray optics and a one‐dimensional position‐sensitive detector, is presented. The high potential of this setup is demonstrated by a phase analysis study of pentacene thin films and the determination of in‐plane lattice constants of pentacene mono‐ and multilayers. The quality of the results compare well to studies performed at synchrotron radiation facilities.
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S0021889812000908