Piezotronic strain sensor based on single bridged ZnO wires

We demonstrate a piezotronic strain sensor based on cyclic stretching–releasing of single ZnO wires, which was employed to detect movement frequencies of an atomic force microscope (AFM) tip. Our results show that the resistance of single ZnO wires decreases as the tensile strains in the wire increa...

Full description

Saved in:
Bibliographic Details
Published in:Physica status solidi. PSS-RRL. Rapid research letters 2009-10, Vol.3 (7-8), p.269-271
Main Authors: Yang, Y., Qi, J. J., Gu, Y. S., Wang, X. Q., Zhang, Y.
Format: Article
Language:English
Subjects:
68.37.Ps
77.65.Ly
81.05.Dz
85.50.−n
Atomic force microscopy
Devices
Piezoelectricity
Piezoresistance
Sensors
Strain
Wire
Zinc oxide
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We demonstrate a piezotronic strain sensor based on cyclic stretching–releasing of single ZnO wires, which was employed to detect movement frequencies of an atomic force microscope (AFM) tip. Our results show that the resistance of single ZnO wires decreases as the tensile strains in the wire increase, which is suggested to be attributed to both piezoelectric and piezoresistance effects. These fabricated devices were found to have a sufficiently high sensitivity (about 200%) and a fast response time to the tensile strains. It could open up new applications of manufacturing frequency detectors. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) The authors demonstrate a piezotronic strain sensor based on cyclic stretching–releasing of single ZnO wires, which was employed to detect movement frequencies of an atomic force microscope tip. The fabricated devices have a sufficient high sensitivity and fast response time to the tensile strains. It could open up new applications of manufacturing frequency detectors.
ISSN:1862-6254
1862-6270
1862-6270
DOI:10.1002/pssr.200903231