Determination of Solubility Parameters for Organic Semiconductor Formulations

The concept of Hansen solubility parameters (HSP) is applied to organic semiconductors in order to determine and predict their solubility behavior, which is essential for the design of functional and environmentally friendly ink formulations for organic photovoltaics. Two different conjugated polyme...

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Bibliographic Details
Published in:Macromolecular chemistry and physics 2011-10, Vol.212 (19), p.2159-2165
Main Authors: Machui, Florian, Abbott, Steven, Waller, David, Koppe, Markus, Brabec, Christoph J.
Format: Article
Language:English
Subjects:
Applied sciences
conjugated polymers
Derivatives
Electronics
Exact sciences and technology
Formulations
fullerenes
Hansen solubility parameters (HSP)
ink formulations
Inks
organic photovoltaics
Organic polymers
Organic semiconductors
Physicochemistry of polymers
Polymers
Properties and characterization
Solubility
Solubility parameters
Thermal and thermodynamic properties
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Summary:The concept of Hansen solubility parameters (HSP) is applied to organic semiconductors in order to determine and predict their solubility behavior, which is essential for the design of functional and environmentally friendly ink formulations for organic photovoltaics. Two different conjugated polymers, one semicrystalline and one dominantly amorphous, and one fullerene derivative are selected as prototype candidates to evaluate the applicability of the HSP concept for organic semiconductors. The method for determining the solubility parameters is described and the quality of the HSP fits as well as their suitability for designing of organic electronic inks are discussed in detail. The applicability of Hansen solubility parameters in designing organic semiconductor ink formulations is analyzed by determining and predicting the solubility behavior of three different organic semiconductors. A large number of solvents are studied and temperature‐dependent solubility is examined to enhance the practical relevance of this work.
ISSN:1022-1352
1521-3935
1521-3935
DOI:10.1002/macp.201100284