Study on the Microwave Transmission Characteristics of a Three-Dimensional Electromagnetic Bandgap Structure with Coupled Defects

• Published in: Journal of electronic materials 2012-03, Vol.41 (3), p.514-518
• Main Authors: Chen, Shibin, Li, Dichen, Tian, Xiaoyong, Han, Haoxue, Wu, Haihua
• Format: Article
• Language: English
• Subjects: Aluminum oxide; Banded structure; Characterization and Evaluation of Materials; Chemistry and Materials Science; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Defects; Diamonds; Electromagnetics; Electron density of states and band structure of crystalline solids; Electron states; Electronics and Microelectronics; Exact sciences and technology; Instrumentation; Materials Science; Microwave transmission; Microwaves; Optical and Electronic Materials; Other inorganic compounds; Physics; Solid State Physics; Stereolithography; Three dimensional; Transmission efficiency
• ISSN: 0361-5235; 1543-186X
• DOI: 10.1007/s11664-011-1795-6

The influence of a vertical coupled defect on the localized properties of a diamond electromagnetic bandgap (EBG) structure has been studied in the present research. The diamond EBG structure with a cavity defect was fabricated by stereolithography and gel-casting processes with alumina slurry. The resonant peaks of two kinds of defects were compared by measuring their microwave transmission characteristics using a network analyzer. A higher quality factor ( Q ) was obtained for the diamond EBG structure with a vertical coupled defect, and the transmission efficiency of resonant peak was improved by 29.6% in comparison with a single defect. Experimental results agreed with the simulation results. These microwave transmission characteristics of the three-dimensional (3D) EBG structures indicate that they can be applied in microwave devices to improve transmission efficiency.