Van Der Pauw method for measuring resistivities of anisotropic layers printed on textile substrates

Electrically conducting layers have been screen printed on woven textile substrates. Using the Van Der Pauw method for electrical resistivity measurements in thin layers, it was observed that the screen-printed layers showed anisotropic behavior. In order to be able to interpret the measurements cor...

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Bibliographic Details
Published in:Textile research journal 2011-12, Vol.81 (20), p.2117-2124
Main Authors: Kazani, Ilda, De Mey, Gilbert, Hertleer, Carla, Banaszczyk, Jedrzej, Schwarz, Anne, Guxho, Genti, Van Langenhove, Lieva
Format: Article
Language:English
Subjects:
Anisotropy
Conduction
Electrical resistivity
Electrotextiles
Mathematical analysis
Measurement techniques
Mechanical properties
Screens
Studies
Textile printing
Textile research
Textiles
Thin films
Weft
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Summary:Electrically conducting layers have been screen printed on woven textile substrates. Using the Van Der Pauw method for electrical resistivity measurements in thin layers, it was observed that the screen-printed layers showed anisotropic behavior. In order to be able to interpret the measurements correctly, a mathematical analysis of the measuring method has been established. From the experimental results one is then able to find the relation between the electrical resistivity in the warp versus the weft direction.
ISSN:0040-5175
1746-7748
DOI:10.1177/0040517511416280