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Van Der Pauw method for measuring resistivities of anisotropic layers printed on textile substrates
Electrically conducting layers have been screen printed on woven textile substrates. Using the Van Der Pauw method for electrical resistivity measurements in thin layers, it was observed that the screen-printed layers showed anisotropic behavior. In order to be able to interpret the measurements cor...
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Published in: | Textile research journal 2011-12, Vol.81 (20), p.2117-2124 |
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container_end_page | 2124 |
container_issue | 20 |
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container_title | Textile research journal |
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creator | Kazani, Ilda De Mey, Gilbert Hertleer, Carla Banaszczyk, Jedrzej Schwarz, Anne Guxho, Genti Van Langenhove, Lieva |
description | Electrically conducting layers have been screen printed on woven textile substrates. Using the Van Der Pauw method for electrical resistivity measurements in thin layers, it was observed that the screen-printed layers showed anisotropic behavior. In order to be able to interpret the measurements correctly, a mathematical analysis of the measuring method has been established. From the experimental results one is then able to find the relation between the electrical resistivity in the warp versus the weft direction. |
doi_str_mv | 10.1177/0040517511416280 |
format | article |
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From the experimental results one is then able to find the relation between the electrical resistivity in the warp versus the weft direction.</description><subject>Anisotropy</subject><subject>Conduction</subject><subject>Electrical resistivity</subject><subject>Electrotextiles</subject><subject>Mathematical analysis</subject><subject>Measurement techniques</subject><subject>Mechanical properties</subject><subject>Screens</subject><subject>Studies</subject><subject>Textile printing</subject><subject>Textile research</subject><subject>Textiles</subject><subject>Thin films</subject><subject>Weft</subject><issn>0040-5175</issn><issn>1746-7748</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp1kM1LxDAQxYMouK7ePQZPXqpJkzTtUdZPEPSgXks2naxZus2aSdX9721ZQVjwNAPv9x4zj5BTzi441_qSMckU14pzyYu8ZHtkwrUsMq1luU8mo5yN-iE5QlwyxspSlxNi30xHryHSZ9N_0RWk99BQF-KwGuyj7xY0AnpM_tMnD0iDo6bzGFIMa29pazYQka4HMkFDQ0cTfCffAsV-jimaBHhMDpxpEU5-55S83t68zO6zx6e7h9nVY2aF5Cmbu8YwURW54ZwzK5yULi-cVRaEZFqzwkoQglUll1I5O69UWRRNo6wSlZorMSXn29x1DB89YKpXHi20rekg9FhzJrjINav4gJ7toMvQx264rq4GTKiiHCG2hWwMiBFcPby5MnEzJNVj6fVu6YMl21rQLOAv81_-B-5bgRM</recordid><startdate>20111201</startdate><enddate>20111201</enddate><creator>Kazani, Ilda</creator><creator>De Mey, Gilbert</creator><creator>Hertleer, Carla</creator><creator>Banaszczyk, Jedrzej</creator><creator>Schwarz, Anne</creator><creator>Guxho, Genti</creator><creator>Van Langenhove, Lieva</creator><general>SAGE Publications</general><general>Sage Publications Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7SR</scope><scope>7X2</scope><scope>7XB</scope><scope>88I</scope><scope>8AF</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FK</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ATCPS</scope><scope>AZQEC</scope><scope>BEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>EHMNL</scope><scope>F28</scope><scope>FR3</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L6V</scope><scope>M0K</scope><scope>M2P</scope><scope>M7S</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0X</scope></search><sort><creationdate>20111201</creationdate><title>Van Der Pauw method for measuring resistivities of anisotropic layers printed on textile substrates</title><author>Kazani, Ilda ; 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Using the Van Der Pauw method for electrical resistivity measurements in thin layers, it was observed that the screen-printed layers showed anisotropic behavior. In order to be able to interpret the measurements correctly, a mathematical analysis of the measuring method has been established. From the experimental results one is then able to find the relation between the electrical resistivity in the warp versus the weft direction.</abstract><cop>London, England</cop><pub>SAGE Publications</pub><doi>10.1177/0040517511416280</doi><tpages>8</tpages></addata></record> |
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subjects | Anisotropy Conduction Electrical resistivity Electrotextiles Mathematical analysis Measurement techniques Mechanical properties Screens Studies Textile printing Textile research Textiles Thin films Weft |
title | Van Der Pauw method for measuring resistivities of anisotropic layers printed on textile substrates |
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