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Memristive tri-stable resistive switching at ruptured conducting filaments of a Pt/TiO sub(2)/Pt cell

A tri-stable memristive switching was demonstrated on a Pt/TiO sub(2)/Pt device and its underlying mechanism was suggested through a series of electrical measurements. Tri-stable switching could be initiated from a device in unipolar reset status. The unipolar reset status was obtained by performing...

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Published in:Nanotechnology 2012-05, Vol.23 (18), p.185202-1-8
Main Authors: Yoon, K J, Lee, M H, Kim, G H, Song, S J, Seok, J Y, Han, S, Yoon, J H, Kim, K M, Hwang, C S
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container_issue 18
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container_title Nanotechnology
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creator Yoon, K J
Lee, M H
Kim, G H
Song, S J
Seok, J Y
Han, S
Yoon, J H
Kim, K M
Hwang, C S
description A tri-stable memristive switching was demonstrated on a Pt/TiO sub(2)/Pt device and its underlying mechanism was suggested through a series of electrical measurements. Tri-stable switching could be initiated from a device in unipolar reset status. The unipolar reset status was obtained by performing an electroforming step on a pristine cell which was then followed by unipolar reset switching. It was postulated that tri-stable switching occurred at the location where the conductive filament (initially formed by the electroforming step) was ruptured by a subsequent unipolar reset process. The mechanism of the tri-stable memristive switching presented in this article was attributed to the migration of oxygen ions through the ruptured filament region and the resulting modulation of the Schottky-like interfaces. The assertion was further supported by a comparison study performed on a Pt/TiO sub(2)/TiO sub(2-x)/Pt cell.
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fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_1031336354</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1031336354</sourcerecordid><originalsourceid>FETCH-proquest_miscellaneous_10313363543</originalsourceid><addsrcrecordid>eNqVir1qAkEURqeIoFFfIdxSi8387ZpJLRGboIW9jOtdMzK7a-beSV5fBUkf-OCDc44QL1q9auWcVO_VW1GWrpTGSu1uq4wyT2L0J4bimeislNbO6JHAT2xTIA4_CJxCQewPESEhPSD9Bq6_QncCz5DyhXPCI9R9d8w133ETom-xY4K-AQ9blruwAcqHmZnLLUONMU7EoPGRcPr4sZitPnbLdXFJ_XdG4n0b6B76DvtMe62stnZhq9L-I70C2SxP2A</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1031336354</pqid></control><display><type>article</type><title>Memristive tri-stable resistive switching at ruptured conducting filaments of a Pt/TiO sub(2)/Pt cell</title><source>Institute of Physics:Jisc Collections:IOP Publishing Read and Publish 2024-2025 (Reading List)</source><creator>Yoon, K J ; Lee, M H ; Kim, G H ; Song, S J ; Seok, J Y ; Han, S ; Yoon, J H ; Kim, K M ; Hwang, C S</creator><creatorcontrib>Yoon, K J ; Lee, M H ; Kim, G H ; Song, S J ; Seok, J Y ; Han, S ; Yoon, J H ; Kim, K M ; Hwang, C S</creatorcontrib><description>A tri-stable memristive switching was demonstrated on a Pt/TiO sub(2)/Pt device and its underlying mechanism was suggested through a series of electrical measurements. Tri-stable switching could be initiated from a device in unipolar reset status. The unipolar reset status was obtained by performing an electroforming step on a pristine cell which was then followed by unipolar reset switching. It was postulated that tri-stable switching occurred at the location where the conductive filament (initially formed by the electroforming step) was ruptured by a subsequent unipolar reset process. The mechanism of the tri-stable memristive switching presented in this article was attributed to the migration of oxygen ions through the ruptured filament region and the resulting modulation of the Schottky-like interfaces. The assertion was further supported by a comparison study performed on a Pt/TiO sub(2)/TiO sub(2-x)/Pt cell.</description><identifier>ISSN: 0957-4484</identifier><identifier>DOI: 10.1088/0957-4484/23/18/185202</identifier><language>eng</language><subject>Devices ; Electroforming ; Filaments ; Migration ; Modulation ; Platinum ; Switching ; Titanium dioxide</subject><ispartof>Nanotechnology, 2012-05, Vol.23 (18), p.185202-1-8</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Yoon, K J</creatorcontrib><creatorcontrib>Lee, M H</creatorcontrib><creatorcontrib>Kim, G H</creatorcontrib><creatorcontrib>Song, S J</creatorcontrib><creatorcontrib>Seok, J Y</creatorcontrib><creatorcontrib>Han, S</creatorcontrib><creatorcontrib>Yoon, J H</creatorcontrib><creatorcontrib>Kim, K M</creatorcontrib><creatorcontrib>Hwang, C S</creatorcontrib><title>Memristive tri-stable resistive switching at ruptured conducting filaments of a Pt/TiO sub(2)/Pt cell</title><title>Nanotechnology</title><description>A tri-stable memristive switching was demonstrated on a Pt/TiO sub(2)/Pt device and its underlying mechanism was suggested through a series of electrical measurements. Tri-stable switching could be initiated from a device in unipolar reset status. The unipolar reset status was obtained by performing an electroforming step on a pristine cell which was then followed by unipolar reset switching. It was postulated that tri-stable switching occurred at the location where the conductive filament (initially formed by the electroforming step) was ruptured by a subsequent unipolar reset process. The mechanism of the tri-stable memristive switching presented in this article was attributed to the migration of oxygen ions through the ruptured filament region and the resulting modulation of the Schottky-like interfaces. The assertion was further supported by a comparison study performed on a Pt/TiO sub(2)/TiO sub(2-x)/Pt cell.</description><subject>Devices</subject><subject>Electroforming</subject><subject>Filaments</subject><subject>Migration</subject><subject>Modulation</subject><subject>Platinum</subject><subject>Switching</subject><subject>Titanium dioxide</subject><issn>0957-4484</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNqVir1qAkEURqeIoFFfIdxSi8387ZpJLRGboIW9jOtdMzK7a-beSV5fBUkf-OCDc44QL1q9auWcVO_VW1GWrpTGSu1uq4wyT2L0J4bimeislNbO6JHAT2xTIA4_CJxCQewPESEhPSD9Bq6_QncCz5DyhXPCI9R9d8w133ETom-xY4K-AQ9blruwAcqHmZnLLUONMU7EoPGRcPr4sZitPnbLdXFJ_XdG4n0b6B76DvtMe62stnZhq9L-I70C2SxP2A</recordid><startdate>20120511</startdate><enddate>20120511</enddate><creator>Yoon, K J</creator><creator>Lee, M H</creator><creator>Kim, G H</creator><creator>Song, S J</creator><creator>Seok, J Y</creator><creator>Han, S</creator><creator>Yoon, J H</creator><creator>Kim, K M</creator><creator>Hwang, C S</creator><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20120511</creationdate><title>Memristive tri-stable resistive switching at ruptured conducting filaments of a Pt/TiO sub(2)/Pt cell</title><author>Yoon, K J ; Lee, M H ; Kim, G H ; Song, S J ; Seok, J Y ; Han, S ; Yoon, J H ; Kim, K M ; Hwang, C S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_miscellaneous_10313363543</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Devices</topic><topic>Electroforming</topic><topic>Filaments</topic><topic>Migration</topic><topic>Modulation</topic><topic>Platinum</topic><topic>Switching</topic><topic>Titanium dioxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yoon, K J</creatorcontrib><creatorcontrib>Lee, M H</creatorcontrib><creatorcontrib>Kim, G H</creatorcontrib><creatorcontrib>Song, S J</creatorcontrib><creatorcontrib>Seok, J Y</creatorcontrib><creatorcontrib>Han, S</creatorcontrib><creatorcontrib>Yoon, J H</creatorcontrib><creatorcontrib>Kim, K M</creatorcontrib><creatorcontrib>Hwang, C S</creatorcontrib><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Nanotechnology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yoon, K J</au><au>Lee, M H</au><au>Kim, G H</au><au>Song, S J</au><au>Seok, J Y</au><au>Han, S</au><au>Yoon, J H</au><au>Kim, K M</au><au>Hwang, C S</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Memristive tri-stable resistive switching at ruptured conducting filaments of a Pt/TiO sub(2)/Pt cell</atitle><jtitle>Nanotechnology</jtitle><date>2012-05-11</date><risdate>2012</risdate><volume>23</volume><issue>18</issue><spage>185202</spage><epage>1-8</epage><pages>185202-1-8</pages><issn>0957-4484</issn><abstract>A tri-stable memristive switching was demonstrated on a Pt/TiO sub(2)/Pt device and its underlying mechanism was suggested through a series of electrical measurements. Tri-stable switching could be initiated from a device in unipolar reset status. The unipolar reset status was obtained by performing an electroforming step on a pristine cell which was then followed by unipolar reset switching. It was postulated that tri-stable switching occurred at the location where the conductive filament (initially formed by the electroforming step) was ruptured by a subsequent unipolar reset process. The mechanism of the tri-stable memristive switching presented in this article was attributed to the migration of oxygen ions through the ruptured filament region and the resulting modulation of the Schottky-like interfaces. The assertion was further supported by a comparison study performed on a Pt/TiO sub(2)/TiO sub(2-x)/Pt cell.</abstract><doi>10.1088/0957-4484/23/18/185202</doi></addata></record>
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source Institute of Physics:Jisc Collections:IOP Publishing Read and Publish 2024-2025 (Reading List)
subjects Devices
Electroforming
Filaments
Migration
Modulation
Platinum
Switching
Titanium dioxide
title Memristive tri-stable resistive switching at ruptured conducting filaments of a Pt/TiO sub(2)/Pt cell
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T20%3A56%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Memristive%20tri-stable%20resistive%20switching%20at%20ruptured%20conducting%20filaments%20of%20a%20Pt/TiO%20sub(2)/Pt%20cell&rft.jtitle=Nanotechnology&rft.au=Yoon,%20K%20J&rft.date=2012-05-11&rft.volume=23&rft.issue=18&rft.spage=185202&rft.epage=1-8&rft.pages=185202-1-8&rft.issn=0957-4484&rft_id=info:doi/10.1088/0957-4484/23/18/185202&rft_dat=%3Cproquest%3E1031336354%3C/proquest%3E%3Cgrp_id%3Ecdi_FETCH-proquest_miscellaneous_10313363543%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1031336354&rft_id=info:pmid/&rfr_iscdi=true