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Crystallographic effect on subsurface damage formation in silicon microcutting
Nanoprecision plunge cutting tests were carried out on single-crystal silicon (001) samples along various directions at different tool rake angles, and subsurface damage was characterized by cross-sectional transmission electron microscopy and laser micro-Raman spectroscopy. It was found that amorph...
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Published in: | CIRP annals 2012, Vol.61 (1), p.131-134 |
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creator | Yan, Jiwang Asami, Tooru Harada, Hirofumi Kuriyagawa, Tsunemoto |
description | Nanoprecision plunge cutting tests were carried out on single-crystal silicon (001) samples along various directions at different tool rake angles, and subsurface damage was characterized by cross-sectional transmission electron microscopy and laser micro-Raman spectroscopy. It was found that amorphization, poly-crystallization, dislocation and internal microcracking occurred and these material responses depended strongly on the cutting direction. When cutting in the [1 1¯ 0] and [0 1¯ 0] directions, deep line defects consisting of microcracks and dislocation groups occurred even when the surface was “ductile”-cut; while for the [128 309¯ 0] direction, the damage depth was reduced by a factor of five. |
doi_str_mv | 10.1016/j.cirp.2012.03.070 |
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subjects | Condensed matter: structure, mechanical and thermal properties Cutting Cutting parameters Cutting tool materials Damage Dislocations Equations of state, phase equilibria, and phase transitions Exact sciences and technology Nanostructure Physics Rakes Silicon Single crystal Solid-liquid transitions Specific phase transitions Surface integrity |
title | Crystallographic effect on subsurface damage formation in silicon microcutting |
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