Loading…

Crystallographic effect on subsurface damage formation in silicon microcutting

Nanoprecision plunge cutting tests were carried out on single-crystal silicon (001) samples along various directions at different tool rake angles, and subsurface damage was characterized by cross-sectional transmission electron microscopy and laser micro-Raman spectroscopy. It was found that amorph...

Full description

Saved in:
Bibliographic Details
Published in:CIRP annals 2012, Vol.61 (1), p.131-134
Main Authors: Yan, Jiwang, Asami, Tooru, Harada, Hirofumi, Kuriyagawa, Tsunemoto
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c429t-1a2fd5bb1f6986daa40a125d8f271e8f655c0ef392403bfa626e264f421da52b3
cites cdi_FETCH-LOGICAL-c429t-1a2fd5bb1f6986daa40a125d8f271e8f655c0ef392403bfa626e264f421da52b3
container_end_page 134
container_issue 1
container_start_page 131
container_title CIRP annals
container_volume 61
creator Yan, Jiwang
Asami, Tooru
Harada, Hirofumi
Kuriyagawa, Tsunemoto
description Nanoprecision plunge cutting tests were carried out on single-crystal silicon (001) samples along various directions at different tool rake angles, and subsurface damage was characterized by cross-sectional transmission electron microscopy and laser micro-Raman spectroscopy. It was found that amorphization, poly-crystallization, dislocation and internal microcracking occurred and these material responses depended strongly on the cutting direction. When cutting in the [1 1¯ 0] and [0 1¯ 0] directions, deep line defects consisting of microcracks and dislocation groups occurred even when the surface was “ductile”-cut; while for the [128 309¯ 0] direction, the damage depth was reduced by a factor of five.
doi_str_mv 10.1016/j.cirp.2012.03.070
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1038241372</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0007850612000728</els_id><sourcerecordid>1038241372</sourcerecordid><originalsourceid>FETCH-LOGICAL-c429t-1a2fd5bb1f6986daa40a125d8f271e8f655c0ef392403bfa626e264f421da52b3</originalsourceid><addsrcrecordid>eNp9kDtPwzAQgD2ARHn8AaYsSCwJZztxUokFVbykChaYrYtzLq7ywk6Q-u9x1YqR6U66714fY9ccMg5c3W0z4_yYCeAiA5lBCSdsAQBlWhWgzth5CFuAooBSLNjbyu_ChG07bDyOX84kZC2ZKRn6JMx1mL1FQ0mDHW4osYPvcHKx5mLZtc7EtHPGD2aeJtdvLtmpxTbQ1TFesM-nx4_VS7p-f35dPaxTk4vllHIUtinqmlu1rFSDmANyUTSVFSWnyqqiMEBWLkUOsraohCKhcpsL3mAhannBbg9zRz98zxQm3blgqG2xp2EOmoOsRM5lKSIqDmi8MgRPVo_edeh3EdJ7YXqr98L0XpgGqaOw2HRznI_BYGs99saFv06hOORQysjdHziKz_448joYR72hxvloUTeD-2_NLxXYhDc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1038241372</pqid></control><display><type>article</type><title>Crystallographic effect on subsurface damage formation in silicon microcutting</title><source>Elsevier:Jisc Collections:Elsevier Read and Publish Agreement 2022-2024:Freedom Collection (Reading list)</source><creator>Yan, Jiwang ; Asami, Tooru ; Harada, Hirofumi ; Kuriyagawa, Tsunemoto</creator><creatorcontrib>Yan, Jiwang ; Asami, Tooru ; Harada, Hirofumi ; Kuriyagawa, Tsunemoto</creatorcontrib><description>Nanoprecision plunge cutting tests were carried out on single-crystal silicon (001) samples along various directions at different tool rake angles, and subsurface damage was characterized by cross-sectional transmission electron microscopy and laser micro-Raman spectroscopy. It was found that amorphization, poly-crystallization, dislocation and internal microcracking occurred and these material responses depended strongly on the cutting direction. When cutting in the [1 1¯ 0] and [0 1¯ 0] directions, deep line defects consisting of microcracks and dislocation groups occurred even when the surface was “ductile”-cut; while for the [128 309¯ 0] direction, the damage depth was reduced by a factor of five.</description><identifier>ISSN: 0007-8506</identifier><identifier>DOI: 10.1016/j.cirp.2012.03.070</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Cutting ; Cutting parameters ; Cutting tool materials ; Damage ; Dislocations ; Equations of state, phase equilibria, and phase transitions ; Exact sciences and technology ; Nanostructure ; Physics ; Rakes ; Silicon ; Single crystal ; Solid-liquid transitions ; Specific phase transitions ; Surface integrity</subject><ispartof>CIRP annals, 2012, Vol.61 (1), p.131-134</ispartof><rights>2012 CIRP</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c429t-1a2fd5bb1f6986daa40a125d8f271e8f655c0ef392403bfa626e264f421da52b3</citedby><cites>FETCH-LOGICAL-c429t-1a2fd5bb1f6986daa40a125d8f271e8f655c0ef392403bfa626e264f421da52b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,776,780,785,786,4010,4036,4037,23909,23910,25118,27900,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=26104073$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Yan, Jiwang</creatorcontrib><creatorcontrib>Asami, Tooru</creatorcontrib><creatorcontrib>Harada, Hirofumi</creatorcontrib><creatorcontrib>Kuriyagawa, Tsunemoto</creatorcontrib><title>Crystallographic effect on subsurface damage formation in silicon microcutting</title><title>CIRP annals</title><description>Nanoprecision plunge cutting tests were carried out on single-crystal silicon (001) samples along various directions at different tool rake angles, and subsurface damage was characterized by cross-sectional transmission electron microscopy and laser micro-Raman spectroscopy. It was found that amorphization, poly-crystallization, dislocation and internal microcracking occurred and these material responses depended strongly on the cutting direction. When cutting in the [1 1¯ 0] and [0 1¯ 0] directions, deep line defects consisting of microcracks and dislocation groups occurred even when the surface was “ductile”-cut; while for the [128 309¯ 0] direction, the damage depth was reduced by a factor of five.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cutting</subject><subject>Cutting parameters</subject><subject>Cutting tool materials</subject><subject>Damage</subject><subject>Dislocations</subject><subject>Equations of state, phase equilibria, and phase transitions</subject><subject>Exact sciences and technology</subject><subject>Nanostructure</subject><subject>Physics</subject><subject>Rakes</subject><subject>Silicon</subject><subject>Single crystal</subject><subject>Solid-liquid transitions</subject><subject>Specific phase transitions</subject><subject>Surface integrity</subject><issn>0007-8506</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNp9kDtPwzAQgD2ARHn8AaYsSCwJZztxUokFVbykChaYrYtzLq7ywk6Q-u9x1YqR6U66714fY9ccMg5c3W0z4_yYCeAiA5lBCSdsAQBlWhWgzth5CFuAooBSLNjbyu_ChG07bDyOX84kZC2ZKRn6JMx1mL1FQ0mDHW4osYPvcHKx5mLZtc7EtHPGD2aeJtdvLtmpxTbQ1TFesM-nx4_VS7p-f35dPaxTk4vllHIUtinqmlu1rFSDmANyUTSVFSWnyqqiMEBWLkUOsraohCKhcpsL3mAhannBbg9zRz98zxQm3blgqG2xp2EOmoOsRM5lKSIqDmi8MgRPVo_edeh3EdJ7YXqr98L0XpgGqaOw2HRznI_BYGs99saFv06hOORQysjdHziKz_448joYR72hxvloUTeD-2_NLxXYhDc</recordid><startdate>2012</startdate><enddate>2012</enddate><creator>Yan, Jiwang</creator><creator>Asami, Tooru</creator><creator>Harada, Hirofumi</creator><creator>Kuriyagawa, Tsunemoto</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7TA</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>2012</creationdate><title>Crystallographic effect on subsurface damage formation in silicon microcutting</title><author>Yan, Jiwang ; Asami, Tooru ; Harada, Hirofumi ; Kuriyagawa, Tsunemoto</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c429t-1a2fd5bb1f6986daa40a125d8f271e8f655c0ef392403bfa626e264f421da52b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Cutting</topic><topic>Cutting parameters</topic><topic>Cutting tool materials</topic><topic>Damage</topic><topic>Dislocations</topic><topic>Equations of state, phase equilibria, and phase transitions</topic><topic>Exact sciences and technology</topic><topic>Nanostructure</topic><topic>Physics</topic><topic>Rakes</topic><topic>Silicon</topic><topic>Single crystal</topic><topic>Solid-liquid transitions</topic><topic>Specific phase transitions</topic><topic>Surface integrity</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yan, Jiwang</creatorcontrib><creatorcontrib>Asami, Tooru</creatorcontrib><creatorcontrib>Harada, Hirofumi</creatorcontrib><creatorcontrib>Kuriyagawa, Tsunemoto</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Materials Business File</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>CIRP annals</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yan, Jiwang</au><au>Asami, Tooru</au><au>Harada, Hirofumi</au><au>Kuriyagawa, Tsunemoto</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Crystallographic effect on subsurface damage formation in silicon microcutting</atitle><jtitle>CIRP annals</jtitle><date>2012</date><risdate>2012</risdate><volume>61</volume><issue>1</issue><spage>131</spage><epage>134</epage><pages>131-134</pages><issn>0007-8506</issn><abstract>Nanoprecision plunge cutting tests were carried out on single-crystal silicon (001) samples along various directions at different tool rake angles, and subsurface damage was characterized by cross-sectional transmission electron microscopy and laser micro-Raman spectroscopy. It was found that amorphization, poly-crystallization, dislocation and internal microcracking occurred and these material responses depended strongly on the cutting direction. When cutting in the [1 1¯ 0] and [0 1¯ 0] directions, deep line defects consisting of microcracks and dislocation groups occurred even when the surface was “ductile”-cut; while for the [128 309¯ 0] direction, the damage depth was reduced by a factor of five.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.cirp.2012.03.070</doi><tpages>4</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0007-8506
ispartof CIRP annals, 2012, Vol.61 (1), p.131-134
issn 0007-8506
language eng
recordid cdi_proquest_miscellaneous_1038241372
source Elsevier:Jisc Collections:Elsevier Read and Publish Agreement 2022-2024:Freedom Collection (Reading list)
subjects Condensed matter: structure, mechanical and thermal properties
Cutting
Cutting parameters
Cutting tool materials
Damage
Dislocations
Equations of state, phase equilibria, and phase transitions
Exact sciences and technology
Nanostructure
Physics
Rakes
Silicon
Single crystal
Solid-liquid transitions
Specific phase transitions
Surface integrity
title Crystallographic effect on subsurface damage formation in silicon microcutting
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-23T03%3A04%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Crystallographic%20effect%20on%20subsurface%20damage%20formation%20in%20silicon%20microcutting&rft.jtitle=CIRP%20annals&rft.au=Yan,%20Jiwang&rft.date=2012&rft.volume=61&rft.issue=1&rft.spage=131&rft.epage=134&rft.pages=131-134&rft.issn=0007-8506&rft_id=info:doi/10.1016/j.cirp.2012.03.070&rft_dat=%3Cproquest_cross%3E1038241372%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c429t-1a2fd5bb1f6986daa40a125d8f271e8f655c0ef392403bfa626e264f421da52b3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1038241372&rft_id=info:pmid/&rfr_iscdi=true