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Orientation independent retardation imaging using quantitative polarized phase microscopy
Simultaneous optical phase and retardation measurement of a birefringent specimen is demonstrated independently of a priori knowledge of the optic axis orientation. The two‐dimensional retardation distribution in both magnitude and angle of the fast axis orientation is uniquely determined from trans...
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Published in: | Microscopy research and technique 2012-10, Vol.75 (10), p.1416-1419 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Simultaneous optical phase and retardation measurement of a birefringent specimen is demonstrated independently of a priori knowledge of the optic axis orientation. The two‐dimensional retardation distribution in both magnitude and angle of the fast axis orientation is uniquely determined from transverse phase images recorded with a bright field transmission microscope using light polarized at a minimum of three different polarization orientations. This approach opens a new possibility for stain‐free phase and orientation‐independent retardation characterization of samples using only one polarizer without needing other additional optical elements traditionally used in polarimetric measurements. Microsc. Res. Tech. 2012. © 2012 Wiley Periodicals, Inc. |
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ISSN: | 1059-910X 1097-0029 |
DOI: | 10.1002/jemt.22082 |