Long-path second-harmonic interferometer with nanosecond time resolution: reliable diagnostic tool for electron density measurement in pulsed plasma devices

We describe the performance of a second-harmonic interferometer (SHI) to measure, on an optical path exceeding 12 m, the electron plasma density of two plasmoids formed in separate theta-pinch chambers and then merged in a central compression chamber after undergoing acceleration and compression. Th...

Full description

Saved in:
Bibliographic Details
Published in:Optics letters 2012-09, Vol.37 (18), p.3855-3857
Main Authors: Del Rosso, T, Giammanco, F, Anderson, M G, Conti, F, Balvis, A, Isakov, I, Matvienko, V, Strashnoy, G, Waggoner, W, Bonelli, L, Paganini, E, Binderbauer, M W
Format: Article
Language:English
Subjects:
Chambers
Compressing
Compression tests
Density
Devices
Interferometers
Nanocomposites
Nanostructure
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We describe the performance of a second-harmonic interferometer (SHI) to measure, on an optical path exceeding 12 m, the electron plasma density of two plasmoids formed in separate theta-pinch chambers and then merged in a central compression chamber after undergoing acceleration and compression. The excellent mechanical stability and a time resolution better than 50 ns suggest the application of SHI, especially in pulsed plasma devices with limited optical accesses.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.37.003855