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Laser lock-in thermography for thermal contact characterisation of surface layer

Lock-in thermography was applied to determine the thermal contact conductance of a W-layer (140μm) on a CFC-substrate. A lock-in thermography system together with a pulse repetition rate Nd:YAG laser (1064nm, 1–500Hz pulse repetition rate) for layer heating was applied for phase shift measurements o...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2012-11, Vol.693, p.98-103
Main Authors: Semerok, A., Jaubert, F., Fomichev, S.V., Thro, P.-Y., Courtois, X., Grisolia, C.
Format: Article
Language:English
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Summary:Lock-in thermography was applied to determine the thermal contact conductance of a W-layer (140μm) on a CFC-substrate. A lock-in thermography system together with a pulse repetition rate Nd:YAG laser (1064nm, 1–500Hz pulse repetition rate) for layer heating was applied for phase shift measurements on the W-layer. A numerical model for direct phase shift calculations was developed and applied to rapid determination of the Fourier amplitudes and phases of the temperature. Thermal conductance coefficients were obtained by comparing the experimental and simulation phase shifts. ► Lock-in thermography determines a layer/substrate thermal conductance. ► Thermal conductance coefficient of W-layer on a CFC-substrate. ► Model for direct phase shift calculations was developed and applied. ► Rapid determination of the Fourier amplitudes and phases of the temperature. ► Comparing the experimental and simulation phase shifts.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2012.07.007