Transverse electric (TE) and transverse magnetic (TM) X-ray guided modes in a two-layer crystalline heterostructure: A comparison

Polarization effects upon Bragg-case hard X-ray dynamical diffraction in a two-layer crystalline heterostructure waveguide have been investigated with the help of numerical modeling. A difference is shown to exist in both intensities and excitation conditions between TE (transverse electric) and TM...

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Bibliographic Details
Published in:Physica. B, Condensed matter Condensed matter, 2012-11, Vol.407 (21), p.4136-4142
Main Author: Prudnikov, I.R.
Format: Article
Language:English
Subjects:
Condensed matter
Crystal structure
Crystalline heterostructure
Diffraction
Excitation
Hard X-ray guided modes
Heterostructures
Reflectivity
Waveguides
X-ray dynamical diffraction
X-rays
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Summary:Polarization effects upon Bragg-case hard X-ray dynamical diffraction in a two-layer crystalline heterostructure waveguide have been investigated with the help of numerical modeling. A difference is shown to exist in both intensities and excitation conditions between TE (transverse electric) and TM (transverse magnetic) X-ray guided modes that are inherent to the waveguide. A comparison of σ- and π-polarized X-ray reflectivity curves from such a waveguide is performed. Possibilities for the experimental excitation of the TE and TM X-ray guided modes are discussed.
ISSN:0921-4526
1873-2135
DOI:10.1016/j.physb.2012.06.037