Complete polarization analysis of an APPLE II undulator using a soft X-ray polarimeter

Two APPLE II undulators installed on the Diamond I10 beamline have all four magnet arrays shiftable and thus can generate linear polarization at any arbitrary angle from 0° to 180°, as well as all other states of elliptical polarization. To characterize the emitted radiation polarization state from...

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Bibliographic Details
Published in:Journal of synchrotron radiation 2012-11, Vol.19 (6), p.944-948
Main Authors: Wang, Hongchang, Bencok, Peter, Steadman, Paul, Longhi, Emily, Zhu, Jingtao, Wang, Zhanshan
Format: Article
Language:English
Subjects:
Apples
Arrays
Equivalence
Linear polarization
multilayers
Offsets
Polarimeters
Polarization
Soft x-rays
undulators
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Summary:Two APPLE II undulators installed on the Diamond I10 beamline have all four magnet arrays shiftable and thus can generate linear polarization at any arbitrary angle from 0° to 180°, as well as all other states of elliptical polarization. To characterize the emitted radiation polarization state from one APPLE II undulator, the complete polarization measurement was performed using a multilayer‐based soft X‐ray polarimeter. The measurement results appear to show that the linear polarization angle offset is about 6° compared with other measurements at 712 eV, equivalent to an undulator jaw phase offset of 1.1 mm. In addition, the polarization states of various ellipticities have also been measured as a function of the undulator row phase.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S0909049512034851