A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM)

A simple design for an inexpensive, compact, desktop-sized helium free-jet beam source is described. The apparatus, which is Campargue-like in design and utilizes mostly off-the-shelf parts, is capable of producing a centreline intensity of 1.2 × 1019 atoms per second per steradian. The beam perform...

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Bibliographic Details
Published in:Measurement science & technology 2012-10, Vol.23 (10), p.105901-1-7
Main Authors: Barr, M, O'Donnell, K M, Fahy, A, Allison, W, Dastoor, P C
Format: Article
Language:English
Subjects:
Beams (radiation)
Campargue
Flux
Gages
Gaussian
Helium
helium atom microscopy
helium atom scattering
helium beam source
Microscopes
Scanning
SHeM
Stagnation
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Description
Summary:A simple design for an inexpensive, compact, desktop-sized helium free-jet beam source is described. The apparatus, which is Campargue-like in design and utilizes mostly off-the-shelf parts, is capable of producing a centreline intensity of 1.2 × 1019 atoms per second per steradian. The beam performance was investigated using a conventional ion gauge and a stagnation detector, with the latter being used to produce beam flux profiles. The profile of the macroskimmed beam has been experimentally demonstrated to be strongly Gaussian.
ISSN:0957-0233
1361-6501
DOI:10.1088/0957-0233/23/10/105901