Tip-enhanced Raman spectroscopy of carbon nanotubes

This paper presents an overview on the principles of tip‐enhanced Raman spectroscopy (TERS). The technique can be used to record Raman images of carbon nanotubes with high spatial resolution. The high resolution is made possible by local enhancement of the incident and scattered fields. The paper al...

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Bibliographic Details
Published in:Journal of Raman spectroscopy 2009-10, Vol.40 (10), p.1420-1426
Main Authors: Cançado, Luiz Gustavo, Hartschuh, Achim, Novotny, Lukas
Format: Article
Language:English
Subjects:
Carbon nanotubes
Chirality
Defects
Dopants
High resolution
near-field
Raman
Raman spectroscopy
Spatial resolution
TERS
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Summary:This paper presents an overview on the principles of tip‐enhanced Raman spectroscopy (TERS). The technique can be used to record Raman images of carbon nanotubes with high spatial resolution. The high resolution is made possible by local enhancement of the incident and scattered fields. The paper also presents some advances on the science of carbon nanotubes generated by TERS, including the observation of local defects, chirality changes, and dopants. Copyright © 2009 John Wiley & Sons, Ltd. Tip‐enhanced Raman spectroscopy (TERS) provides an alternative way to go beyond the diffraction barrier by performing spectroscopic imaging with ultra‐high spatial resolution. This technique can be used in order to obtain Raman images of carbon nanotubes with high spatial resolution mediated by local enhancement of the incident and scattered fields.
ISSN:0377-0486
1097-4555
DOI:10.1002/jrs.2448