Diamond tool wear measurement by electron-beam-induced deposition

Quantitative characterization of a diamond tool profile is critical to reveal tool wear mechanisms. An electron-beam-induced deposition (EBID) method reported previously is further developed and improved to measure diamond tool profiles using a field emission scanning electron microscope (SEM). The...

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Bibliographic Details
Published in:Precision engineering 2010-10, Vol.34 (4), p.718-721
Main Authors: Shi, M., Lane, B., Mooney, C.B., Dow, T.A., Scattergood, R.O.
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Deposition
Diamond tool wear
Diamond tools
Diamond turning
EBID
Edge radius
Electron and ion emission by liquids and solids
impact phenomena
Exact sciences and technology
Field emission
Land
Mechanical engineering. Machine design
Physics
Precision engineering, watch making
Scanning electron microscopy
Tool wear
Wear
Wear land
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Description
Summary:Quantitative characterization of a diamond tool profile is critical to reveal tool wear mechanisms. An electron-beam-induced deposition (EBID) method reported previously is further developed and improved to measure diamond tool profiles using a field emission scanning electron microscope (SEM). The edge radius and wear land length for new and worn diamond tools were derived from analysis of the EBID-SEM images. Experimental results are presented to show that the methodology is an effective means to characterize diamond tool wear.
ISSN:0141-6359
1873-2372
DOI:10.1016/j.precisioneng.2010.03.009