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Structural and electrical properties of polycrystalline PbZr0.5Ti0.5O3 films deposited on La0.5Sr0.5CoO3 coated silicon by sol-gel process

La0.5Sr0.5CoO3 (LSCO) films have been grown on Si (100) by a metalorganic chemical liquid deposition (MOCLD) technique using lanthanum acetate, strontium acetate and cobalt acetate as the starting materials. Subsequent PbZr0.5Ti0.5O3 (PZT) films were deposited onto LSCO films by a modified sol-gel m...

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Published in:Applied physics. A, Materials science & processing Materials science & processing, 2002-05, Vol.74 (5), p.707-710
Main Authors: WANG, G. S, MENG, X. J, LAI, Z. Q, YU, J, SUN, J. L, CHENG, J. G, TANG, J, GUO, S. L, CHU, J. H
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container_issue 5
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container_title Applied physics. A, Materials science & processing
container_volume 74
creator WANG, G. S
MENG, X. J
LAI, Z. Q
YU, J
SUN, J. L
CHENG, J. G
TANG, J
GUO, S. L
CHU, J. H
description La0.5Sr0.5CoO3 (LSCO) films have been grown on Si (100) by a metalorganic chemical liquid deposition (MOCLD) technique using lanthanum acetate, strontium acetate and cobalt acetate as the starting materials. Subsequent PbZr0.5Ti0.5O3 (PZT) films were deposited onto LSCO films by a modified sol-gel method. Field-emission scanning electron microscopy and X-ray diffraction analysis show that PZT and LSCO films are polycrystalline and entirely perovskite phase. At an applied electric field of 250 kV/cm, the Pt/PZT/LSCO capacitor shows no polarization fatigue after 3X10 switching cycles and an internal electric field; the remnant polarization Pr and the coercive field Ec are about 22 *mC/cm and 73 kV/cm, respectively. The dielectric constant of PZT films is 650 at a frequency of 1 kHz.
doi_str_mv 10.1007/s003390100941
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subjects Acetates
Coercive force
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Deposition
Dielectric, piezoelectric, ferroelectric and antiferroelectric materials
Dielectrics, piezoelectrics, and ferroelectrics and their properties
Electric fields
Exact sciences and technology
Fatigue (materials)
Lead zirconate titanates
Liquid phase epitaxy
deposition from liquid phases (melts, solutions, and surface layers on liquids)
Materials science
Methods of deposition of films and coatings
film growth and epitaxy
Niobates, titanates, tantalates, pzt ceramics, etc
Physics
Polarization
Sol gel process
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
title Structural and electrical properties of polycrystalline PbZr0.5Ti0.5O3 films deposited on La0.5Sr0.5CoO3 coated silicon by sol-gel process
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