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Influence of Composition on the Performance of Sintered Cu(In,Ga)Se2 Nanocrystal Thin-Film Photovoltaic Devices

Thin‐film photovoltaic devices (PVs) were prepared by selenization using oleylamine‐capped Cu(In,Ga)Se2 (CIGS) nanocrystals sintered at a high temperature (>500 °C) under Se vapor. The device performance varied significantly with [Ga]/[In+Ga] content in the nanocrystals. The highest power convers...

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Bibliographic Details
Published in:ChemSusChem 2013-03, Vol.6 (3), p.481-486
Main Authors: Akhavan, Vahid A., Harvey, Taylor B., Stolle, C. Jackson, Ostrowski, David P., Glaz, Micah S., Goodfellow, Brian W., Panthani, Matthew G., Reid, Dariya K., Vanden Bout, David A., Korgel, Brian A.
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Language:English
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Summary:Thin‐film photovoltaic devices (PVs) were prepared by selenization using oleylamine‐capped Cu(In,Ga)Se2 (CIGS) nanocrystals sintered at a high temperature (>500 °C) under Se vapor. The device performance varied significantly with [Ga]/[In+Ga] content in the nanocrystals. The highest power conversion efficiency (PCE) observed in the devices studied was 5.1 % under air mass 1.5 global (AM 1.5 G) illumination, obtained with [Ga]/[In+Ga]=0.32. The variation in PCE with composition is partly a result of bandgap tuning and optimization, but the main influence of nanocrystal composition appeared to be on the quality of the sintered films. The [Cu]/[In+Ga] content was found to be strongly influenced by the [Ga]/[In+Ga] concentration, which appears to be correlated with the morphology of the sintered film. For this reason, only small changes in the [Ga]/[In+Ga] content resulted in significant variations in device efficiency. Composition influences sintering and performance: The performance of selenized Cu(In,Ga)Se2 nanocrystal photovoltaics has been observed to change dramatically with different [Ga]/[In+Ga] ratios in the nanocrystals. The [Ga]/[In+Ga] concentration alters the [Cu]/[In+Ga] content in the nanocrystals, which influences sintering and film morphology (see image), leading to very significant variations in device efficiency.
ISSN:1864-5631
1864-564X
DOI:10.1002/cssc.201200677