Application of single crystalline tungsten for fabrication of high resolution STM probes with controlled structure

The possibility to fabricate scanning tunneling microscopy (STM) probes with controlled electronic structure using single crystalline tungsten tips is discussed. High resolution power of oriented single crystalline probes is demonstrated in atomic and subatomic resolution STM studies of silicon, gal...

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Bibliographic Details
Published in:Russian metallurgy Metally 2011-07, Vol.2011 (7), p.603-609
Main Authors: Chaika, A. N., Nazin, S. S., Semenov, V. N., Glebovskiy, V. G., Bozhko, S. I., Lübben, O., Krasnikov, S. A., Radican, K., Shvets, I. V.
Format: Article
Language:English
Subjects:
Atomic structure
Chemistry and Materials Science
Crystal structure
Graphite
High resolution
Materials Science
Metallic Materials
Scanning tunneling microscopy
Silicon
Stability
Tungsten
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Summary:The possibility to fabricate scanning tunneling microscopy (STM) probes with controlled electronic structure using single crystalline tungsten tips is discussed. High resolution power of oriented single crystalline probes is demonstrated in atomic and subatomic resolution STM studies of silicon, gallium telluride and graphite surfaces. The possibility of controllable selection of the tungsten tip atom electron orbitals responsible for the surface imaging in STM experiments is demonstrated.
ISSN:0036-0295
1555-6255
1531-8648
DOI:10.1134/S0036029511070044