On Extra Combinational Delays in SRAM FPGAs Due to Transient Ionizing Radiations

This paper presents a new experimental setup (to our knowledge, the first ever) and results obtained with that setup from which we report extra combinational delays in an SRAM FPGA (Virtex-5) due to transient ionizing radiations. The results, obtained by proton irradiation at the TRIUMF laboratory,...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on nuclear science 2012-12, Vol.59 (6), p.2959-2965
Main Authors: Thibeault, C., Pichette, S., Audet, Y., Savaria, Y., Rufenacht, H., Gloutnay, E., Blaquiere, Y., Moupfouma, F., Batani, N.
Format: Article
Language:English
Subjects:
Combinational delays
Combinatorial analysis
Delay
experimental setup
Faults
Field programmable gate arrays
Ionizing radiation
Proton irradiation
Proton radiation effects
SRAM FPGA
Static random access memory
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This paper presents a new experimental setup (to our knowledge, the first ever) and results obtained with that setup from which we report extra combinational delays in an SRAM FPGA (Virtex-5) due to transient ionizing radiations. The results, obtained by proton irradiation at the TRIUMF laboratory, show that our setup can detect extra combinatorial delays as small as 40 ps, and that delays of more than 400 ps can affect the targeted FPGA. These results strongly suggest that delay faults can potentially be induced by transient ionizing radiations.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2012.2222668