Small polaronic hole hopping mechanism and Maxwell-Wagner relaxation in NdFeO3

• Published in: Journal of applied physics 2012-10, Vol.112 (7)
• Main Authors: Ahmad, I., Akhtar, M. J., Younas, M., Siddique, M., Hasan, M. M.
• Format: Article
• Language: English
• Subjects: Conduction cooling; Contact; Devices; Dielectric constant; Grain boundaries; Grains; Permittivity; Relaxation time
• ISSN: 0021-8979; 1089-7550
• DOI: 10.1063/1.4754866

In the modern micro-electronics, transition metal oxides due to their colossal values of dielectric permittivity possess huge potential for the development of capacitive energy storage devices. In the present work, the dielectric permittivity and the effects of temperature and frequency on the electrical transport properties of polycrystalline NdFeO3, prepared by solid state reaction method, are discussed. Room temperature Mossbauer spectrum confirms the phase purity, octahedral environment for Fe ion, and high spin state of Fe3+ ion. From the impedance spectroscopic measurements, three relaxation processes are observed, which are related to grains, grain boundaries (gbs), and electrode-semiconductor contact in the measured temperature and frequency ranges. Decrease in resistances and relaxation times of the grains and grain boundaries with temperature confirms the involvement of thermally activated conduction mechanisms. Same type of charge carriers (i.e., small polaron hole hopping) have been found responsible for conduction and relaxation processes through the grain and grain boundaries. The huge value of the dielectric constant (∼8 × 103) at high temperature and low frequency is correlated to the Maxwell-Wagner relaxation due to electrode-sample contact.