Spectrometer for hard X-ray free-electron laser based on diffraction focusing

X‐ray free‐electron lasers (XFELs) generate sequences of ultra‐short spatially coherent pulses of X‐ray radiation. A diffraction focusing spectrometer (DFS), which is able to measure the whole energy spectrum of the radiation of a single XFEL pulse with an energy resolution of ΔE/E≃ 2 × 10−6, is pro...

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Bibliographic Details
Published in:Journal of synchrotron radiation 2013-03, Vol.20 (2), p.258-265
Main Authors: Kohn, V. G., Gorobtsov, O. Y., Vartanyants, I. A.
Format: Article
Language:English
Subjects:
compound refractive lenses
Diffraction
diffraction focusing spectrometer
Focusing
Free electron lasers
hard X-ray free-electron laser
Metamaterials
Plates (structural members)
Spectra
Spectrometers
X-rays
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Summary:X‐ray free‐electron lasers (XFELs) generate sequences of ultra‐short spatially coherent pulses of X‐ray radiation. A diffraction focusing spectrometer (DFS), which is able to measure the whole energy spectrum of the radiation of a single XFEL pulse with an energy resolution of ΔE/E≃ 2 × 10−6, is proposed. This is much better than for most modern X‐ray spectrometers. Such resolution allows one to resolve the fine spectral structure of the XFEL pulse. The effect of diffraction focusing occurs in a single‐crystal plate due to dynamical scattering, and is similar to focusing in a Pendry lens made from a metamaterial with a negative refraction index. Such a spectrometer is easier to operate than those based on bent crystals. It is shown that the DFS can be used in a wide energy range from 5 keV to 20 keV.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S0909049513000903