X-ray wavefront characterization of a Fresnel zone plate using a two-dimensional grating interferometer

The x-ray wavefront downstream of a Fresnel zone plate (FZP) was characterized using a two-dimensional grating interferometer. Transverse wavefront slope maps, measured using a raster phase-stepping scan, allowed accurate phase reconstruction of the x-ray beam. Wavefront measurements revealed that t...

Full description

Saved in:
Bibliographic Details
Published in:Optics letters 2013-03, Vol.38 (6), p.827-829
Main Authors: Wang, Hongchang, Berujon, Sebastien, Pape, Ian, Rutishauser, Simon, David, Christian, Sawhney, Kawal
Format: Article
Language:English
Subjects:
Beams (radiation)
Diffraction gratings
Fresnel zones
Gratings (spectra)
Interferometers
Two dimensional
Wave fronts
X-rays
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The x-ray wavefront downstream of a Fresnel zone plate (FZP) was characterized using a two-dimensional grating interferometer. Transverse wavefront slope maps, measured using a raster phase-stepping scan, allowed accurate phase reconstruction of the x-ray beam. Wavefront measurements revealed that the wavefront error is very sensitive to the input beam entering the FZP. A small stack of one-dimensional compound refractive lenses was used to introduce astigmatism in the probing x-ray beam to investigate the contribution of the incoming beam in contrast to the optical aberrations. Experimental data were shown to be consistent with theoretical calculations.
ISSN:0146-9592
1539-4794
DOI:10.1364/ol.38.000827