Probing the three-dimensional strain inhomogeneity and equilibrium elastic properties of single crystal Ni nanowires

We employ three dimensional x-ray coherent diffraction imaging to map the lattice strain distribution, and to probe the elastic properties of a single crystalline Ni (001) nanowire grown vertically on an amorphous SiO2∥Si substrate. The reconstructed density maps show that with increasing wire width...

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Bibliographic Details
Published in:Applied physics letters 2012-07, Vol.101 (3)
Main Authors: Fohtung, E., Kim, J. W., Chan, Keith T., Harder, Ross, Fullerton, Eric E., Shpyrko, O. G.
Format: Article
Language:English
Subjects:
Compressive properties
Density
Elastic constants
Nanowires
Nickel
Strain
Three dimensional
Wire
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Summary:We employ three dimensional x-ray coherent diffraction imaging to map the lattice strain distribution, and to probe the elastic properties of a single crystalline Ni (001) nanowire grown vertically on an amorphous SiO2∥Si substrate. The reconstructed density maps show that with increasing wire width, the equilibrium compressive stress in the core region decreases sharply while the surface tensile strain increases, and gradually trends to a nonzero constant. We use the retrieved projection of lattice distortion to predict the Young’s Modulus of the wire based on the elasticity theory.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4737440