Plasmon-induced optical field enhancement studied by correlated scanning and photoemission electron microscopy

• Published in: The Journal of chemical physics 2013-04, Vol.138 (15), p.154701-154701
• Main Authors: Peppernick, Samuel J, Joly, Alan G, Beck, Kenneth M, Hess, Wayne P
• Format: Article
• Language: English
• Subjects: Correlation; Electric fields; Nanoparticles; Photoelectrons; Photoemission; Scanning electron microscopy; Silver; Thin films
• ISSN: 0021-9606; 1089-7690
• DOI: 10.1063/1.4799937

We use multi-photon photoemission electron microscopy (PEEM) to image the enhanced electric fields of silver nanoparticles supported on a silver thin film substrate. Electromagnetic field enhancement is measured by comparing the photoelectron yield of the nanoparticles with respect to the photoelectron yield of the surrounding silver thin film. We investigate the dependence of the photoelectron yield of the nanoparticle as a function of size and shape. Multi-photon PEEM results are presented for three average nanoparticle diameters: 34, 75, and 122 nm. The enhancement in photoelectron yield of single nanoparticles illuminated with femtosecond laser pulses (400 nm, ~3.1 eV) is found to be a factor of 10(2) to 10(3) times greater than that produced by the flat silver thin film. High-resolution, multi-photon PEEM images of single silver nanoparticles reveal that the greatest enhancement in photoelectron yield is localized at distinct regions near the surface of the nanoparticle whose magnitude and spatial extent is dependent on the incident electric field polarization. In conjunction with correlated scanning electron microscopy (SEM), nanoparticles that deviate from nominally spherical shapes are found to exhibit irregular spatial distributions in the multi-photon PEEM images that are correlated with the unique shape and topology of the nanoparticle.