Friction measurement on free standing plates using atomic force microscopy

A method is introduced to measure friction on small, free standing objects, specifically microfabricated silicon plates, based on atomic force microscopy (AFM). An AFM tip is brought into contact with the plate resting on a substrate. The substrate is displaced laterally and, provided the AFM tip do...

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Bibliographic Details
Published in:Review of scientific instruments 2013-01, Vol.84 (1), p.013702-013702
Main Authors: Tang, X S, Loke, Y C, Lu, P, Sinha, Sujeet K, O'Shea, S J
Format: Article
Language:English
Subjects:
Atomic force microscopy
Friction
Friction measurement
Loads (forces)
Nanocomposites
Nanomaterials
Nanostructure
Plates
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Summary:A method is introduced to measure friction on small, free standing objects, specifically microfabricated silicon plates, based on atomic force microscopy (AFM). An AFM tip is brought into contact with the plate resting on a substrate. The substrate is displaced laterally and, provided the AFM tip does not slide over the plate, the twisting of the AFM cantilever is used to measure the friction of the underlying plate-substrate interface. The method can measure nano-Newton to micro-Newton forces (both friction and applied load) and provides a means to measure friction of macroscopic structures at low load.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4773534